The promise of GaAs 200 in small-angle neutron scattering for higher resolution.

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology Journal of Applied Crystallography Pub Date : 2024-08-27 eCollection Date: 2024-10-01 DOI:10.1107/S1600576724007246
A Magerl, H Lemmel, M Appel, M Weisser, U Kretzer, M Zobel
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Abstract

The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2 × 10-5 Å-1 (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2 × 10-6 Å-1 provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6 × 10-6 Å-1, six times superior in comparison with a Si 220 setup.

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GaAs 200 在小角中子散射中有望实现更高分辨率。
对于给定的布拉格角,Bonse-Hart 双晶衍射仪的 Q 分辨率由晶体结构因子值决定。迄今为止,Si 220 或 Si 111 反射只用于中子散射,它们提供的三弹晶体分辨率约为 2 × 10-5 Å-1(FWHM)。GaAs 200 反射的达尔文宽度要小 10 倍左右,如果有足够质量的晶体,Q 分辨率有可能达到 2 × 10-6 Å-1。本文报告了使用单跳砷化镓 200 进行的可行性研究,得出的 Q 值分辨率为 4.6 × 10-6 Å-1,是硅 220 设置的六倍。
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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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