An Improved 1X De-Embedding Method for Fixtures With Impedance Discontinuities

Abstract

The conventional 1X de-embedding method based on time-domain reflectometry (TDR) loses accuracy when there are impedance discontinuities at the terminal of fixtures. To address this issue, this article proposes an improved 1X de-embedded method. By connecting an extension line to the terminal of the fixture, which is used as an OPEN_EX standard, the proposed method precisely identifies peaks resulting from the impedance discontinuities at the terminal, thereby accurately reconstruct the ${{\mathbf{S}}_{11}}$ and ${{\mathbf{S}}_{22}}$ of the fixture. The proposed method is performed on numerical and measurement examples and demonstrates higher accuracy, while keeping the same efficiency as the traditional 1X method.