A DPD/Dither-Free DPLL Based on a Cascaded Fractional Divider and Pseudo-Differential DTCs Achieving a —62.1-dBc Fractional Spur

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-10-23 DOI:10.1109/JSSC.2024.3477498
Dingxin Xu;Zezheng Liu;Yifeng Kuai;Hongye Huang;Yuncheng Zhang;Zheng Sun;Bangan Liu;Wenqian Wang;Yuang Xiong;Junjun Qiu;Waleed Madany;Yi Zhang;Ashbir Aviat Fadila;Atsushi Shirane;Kenichi Okada
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Abstract

This article presents a 7-GHz fractional-N digital phase-locked loop (DPLL) without any digital pre-distortion (DPD) on the integral nonlinearity (INL) of the digital-to-time converter (DTC) or dither. Utilizing a cascaded fractional divider, the fractional spur offset frequency can be shifted beyond the PLL bandwidth, resulting in less fractional spur degradation at near-integer channels. A pseudo-differential DTC (PD-DTC) technique that can cancel the even-symmetric nonlinearity components is also employed to achieve a better suppression of the fractional spur. Thanks to the aforementioned two techniques, a −62.1-dBc worst-case fractional spur can be achieved without degrading the in-band PLL phase noise (PN) or PLL locking time. Occupying 0.23-mm2 area in a 65-nm CMOS process, this PLL can achieve a 143.7-fs integrated jitter with a 100-MHz reference frequency and 8.89-mW power consumption, which translates to a figure-of-merit (FoM) of −247.4 dB.
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基于级联分数除法器和伪差分 DTC 的无 DPD/Dither DPLL,可实现 62.1 dBc 美元的分数 Spur
本文提出了一种7 ghz分数n数字锁相环(DPLL),该锁相环不会对数字时间转换器(DTC)的积分非线性(INL)或抖动产生任何数字预失真(DPD)。利用级联分数分频器,分数杂散偏置频率可以移到锁相环带宽之外,从而在近整数信道中减少分数杂散退化。伪微分DTC (PD-DTC)技术可以抵消均匀对称非线性分量,从而更好地抑制分数阶杂散。由于上述两种技术,可以在不降低带内锁相噪声(PN)或锁相时间的情况下实现- 62.1 dbc的最坏情况分数杂散。该锁相环在65纳米CMOS工艺中占地0.23 mm2,可实现143.7 fs的集成抖动,参考频率为100 mhz,功耗为8.89 mw,其性能因数(FoM)为−247.4 dB。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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