Probing electron localization and delocalization in the selective long-range tight-binding model

Abstract

In this study, we perform a detailed investigation into the interplay between disorder-induced electron localization and long-range hopping amplitudes within the Selective Long-Range Tight-Binding Model (SLRTB). Through numerical simulations, we analyze the electronic properties of the system, with a focus on the participation ratio (PR), entanglement entropy (EE), energy spectrum, and the ratio of level spacings (\(r_n\)). Our results reveal a marked distinction between negative and positive long-range hopping amplitudes, manifesting in different electronic behaviors and transitions. Notably, we carry out a finite-size scaling analysis, identifying the critical point and exponents that characterize the system’s behavior near the transition. The investigation highlights the role of gapless regions in shaping the system’s PR, \(r_n\), and EE, and the influence of disorder on these properties. The SLRTB model proves to be an effective framework for understanding the effects of disorder and long-range hopping on electron dynamics, offering valuable insights into localization and delocalization phenomena.