{"title":"A Single-Phase Contention- and Redundant Transition-Free Flip-Flop With Improved DQ Latency","authors":"Bomin Joo;Minkyu Ko;Geonhwi Lee;Bai-Sun Kong","doi":"10.1109/JSSC.2024.3470761","DOIUrl":null,"url":null,"abstract":"Conventional low-power flip-flops with reduced or no redundant transitions suffer from latency increase. To resolve the issue, this article proposes a low-power redundant transition-free flip-flop with reduced latency. It can reduce the latency by reconfiguring the primary stage to let it capture the input data directly. The proposed flip-flop can minimize dynamic power consumption by efficiently removing all redundant transitions. By adopting a full-static and contention-free structure, it can also provide robust operation. The proposed flip-flop was fabricated in a 28-nm CMOS process. The performance evaluation indicates that the proposed flip-flop achieves 26.0% and 21.5% DQ latency reductions from recent low-power flip-flops such as single-phase contention-free flip-flop (S<sup>2</sup>CFF) and REFF, respectively. It also indicates that the power consumption is reduced by 51.2% at 10% switching activity when compared with transmission-gate flip-flop (TGFF), a traditional primary-secondary flip-flop. Contributed by reduced latency and power consumption, the power-delay-product (PDP) of the proposed flip-flop is improved by 53.6%, 44.7%, and 17.1% when compared with TGFF, S<sup>2</sup>CFF, and REFF, respectively. The test of multiple dies having process, voltage, and temperature (PVT) variations indicates that the fully static and contention-free operation of the proposed flip-flop allows a reliable operation at a supply voltage down to 0.29 V without functional failure.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 6","pages":"2249-2260"},"PeriodicalIF":5.6000,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10737373/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Conventional low-power flip-flops with reduced or no redundant transitions suffer from latency increase. To resolve the issue, this article proposes a low-power redundant transition-free flip-flop with reduced latency. It can reduce the latency by reconfiguring the primary stage to let it capture the input data directly. The proposed flip-flop can minimize dynamic power consumption by efficiently removing all redundant transitions. By adopting a full-static and contention-free structure, it can also provide robust operation. The proposed flip-flop was fabricated in a 28-nm CMOS process. The performance evaluation indicates that the proposed flip-flop achieves 26.0% and 21.5% DQ latency reductions from recent low-power flip-flops such as single-phase contention-free flip-flop (S2CFF) and REFF, respectively. It also indicates that the power consumption is reduced by 51.2% at 10% switching activity when compared with transmission-gate flip-flop (TGFF), a traditional primary-secondary flip-flop. Contributed by reduced latency and power consumption, the power-delay-product (PDP) of the proposed flip-flop is improved by 53.6%, 44.7%, and 17.1% when compared with TGFF, S2CFF, and REFF, respectively. The test of multiple dies having process, voltage, and temperature (PVT) variations indicates that the fully static and contention-free operation of the proposed flip-flop allows a reliable operation at a supply voltage down to 0.29 V without functional failure.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.