A Low-Jitter and Low-Reference-Spur Ring-VCO-Based Injection-Locked Clock Multiplier Utilizing a Complementary-Injection Scheme and an Adaptive Pulsewidth Adjustment

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-11-05 DOI:10.1109/JSSC.2024.3486291
Zedong Wang;Xuqiang Zheng;Yu He;Hua Xu;Sai Li;Zunsong Yang;Fangxu Lv;Mingche Lai;Xinyu Liu
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Abstract

This article presents a ring voltage-controlled oscillator (RVCO)-based pulse-injection-locked clock multiplier (ILCM) with a complementary-injection scheme, an adaptive pulsewidth adjustment, and a hybrid frequency tracking loop (FTL). The developed complementary-injection scheme introduces a combination of traditional narrow-pulse injection and wide-pulse injection to achieve phase error cancellation and enhance noise suppression. Based on the derived optimal pulsewidth principle, the proposed adaptive pulsewidth adjustment technique automatically maintains the optimal noise suppression across process, voltage, and temperature (PVT) variations. To achieve enhanced in-band noise suppression and extend the locking range, a hybrid FTL that incorporates a conventional phase-locked loop (PLL), a developed timing-adjusted loop (TAL), and an automatic locking mechanism (ALM) is designed. Fabricated in a 28-nm CMOS process, the ILCM occupies an active area of 0.133 mm2. The measurement results show that it achieves 43.9-fs rms jitter and −59.1-dBc spur level. The calculated figure-of-merit (FoM) is −255.5 dB, which outperforms other state-of-the-art works.
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利用互补注入方案和自适应脉宽调节的低抖动、低参考谱环形 VCO 注入锁定时钟乘法器
本文提出了一种基于环形压控振荡器(RVCO)的脉冲注入锁定时钟乘法器(ILCM),该乘法器具有互补注入方案、自适应脉宽调节和混合频率跟踪环路(FTL)。所开发的互补注入方案将传统的窄脉冲注入和宽脉冲注入相结合,以实现相位误差抵消和增强噪声抑制。基于导出的最优脉宽原理,提出的自适应脉宽调整技术在过程、电压和温度(PVT)变化中自动保持最佳噪声抑制。为了实现更强的带内噪声抑制和扩展锁定范围,设计了一种混合FTL,该混合FTL结合了传统的锁相环(PLL)、开发的时序调整环(TAL)和自动锁定机构(ALM)。ILCM采用28纳米CMOS工艺制造,其有效面积为0.133 mm2。测量结果表明,该系统实现了43.9 fs rms的抖动和59.1 dbc的杂散电平。计算的性能因数(FoM)为- 255.5 dB,优于其他最先进的作品。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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