A 65-nm Proactive Power Management Technique With Real-Time Machine Learning Engine for Droop Prediction and Mitigation on Microprocessors

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-11-05 DOI:10.1109/JSSC.2024.3479273
Xi Chen;Jiaxiang Feng;Aly Shoukry;Xin Zhang;Raveesh Magod;Nachiket Desai;Jie Gu
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Abstract

A proactive power management (PM) scheme for mitigating dynamic supply droop is proposed with a fully integrated buck converter, an RISC-V CPU core, a real-time machine learning engine (MLE), and a safety droop guardband. The dynamic supply is modeled using an RV32IM ISA CPU and the model was simulated in a customized co-sim environment. The MLE is used to predict the supply droop on a cycle-by-cycle basis for proactive supply regulation from the integrated buck converter through a fast PWM modulation of the power switches. In addition, to deal with the misprediction of MLE and other long-term supply droops that cannot be captured by MLE, a safety droop guardband is implemented to secure the integrity of the supply voltage. The proposed proactive scheme has been implemented on a 65-nm test chip and demonstrated up to 9.9% higher CPU frequency or 9.2% higher power efficiency compared with prior fast digital LDO schemes.
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采用实时机器学习引擎的 65 纳米主动式电源管理技术,用于预测和缓解微处理器的骤降现象
提出了一种缓解动态电源下垂的主动电源管理(PM)方案,该方案采用全集成降压转换器、RISC-V CPU内核、实时机器学习引擎(MLE)和安全下垂保护带。采用RV32IM ISA CPU对动态电源进行建模,并在定制的co-sim环境中对模型进行仿真。MLE用于预测一个周期一个周期的供电下降,通过快速PWM调制功率开关,从集成降压转换器主动调节供电。此外,为了解决MLE的错误预测和MLE无法捕获的其他长期供电下垂问题,设计了安全下垂保护带,以确保供电电压的完整性。该方案已在65纳米测试芯片上实现,与先前的快速数字LDO方案相比,CPU频率提高了9.9%,功率效率提高了9.2%。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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