A Compact 20–24-GHz Sub-Sampling PLL With Charge-Domain Bandwidth Control Scheme

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-11-07 DOI:10.1109/JSSC.2024.3488277
Li Wang;Zilu Liu;Ruitao Ma;C. Patrick Yue
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Abstract

This article introduces a compact 20–24-GHz integer-N dual-path sub-sampling phase-locked loop (DPSSPLL) with a charge-domain bandwidth control scheme. By leveraging the differential configuration of the type-I path, a charge-neutralization-based switched-capacitor gain control circuit is proposed to effectively optimize the phase-locked loop (PLL) loop bandwidth. Different from conventional approaches that use slope-controlled circuits or charge pumps, the proposed method achieves a wide control range with minimal in-band phase noise (PN) contribution. Rigorous analysis is introduced to accurately predict the frequency response and noise contribution of the proposed topology. The proportional-integral dual-path (DP) architecture, combined with an inductor-less true single-phase clock (TSPC) divider in the feedback path, enables a compact implementation. Fabricated using a 40-nm CMOS process, the prototype demonstrates an integrated jitter of 61.23 fs at 22 GHz from 1 kHz to 100 MHz, accompanied by a figure of merit (FoM) of −253.0 dB and a small core area of 0.057 mm2. The measurement results validate the effectiveness of the proposed gain and bandwidth control scheme.
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采用电荷域带宽控制方案的 20-24-GHz 紧凑型子采样 PLL
本文介绍了一种具有电荷域带宽控制方案的紧凑型20 - 24ghz整数n双路子采样锁相环(DPSSPLL)。利用i型路径的差分配置,提出了一种基于电荷中和的开关电容增益控制电路,以有效地优化锁相环(PLL)环路带宽。与使用斜坡控制电路或电荷泵的传统方法不同,该方法实现了宽的控制范围和最小的带内相位噪声(PN)贡献。为了准确预测所提出的拓扑结构的频率响应和噪声贡献,引入了严格的分析。比例积分双路(DP)架构与反馈路径中的无电感真单相时钟(TSPC)分频器相结合,实现了紧凑的实现。该原型机采用40纳米CMOS工艺制造,在1 kHz至100 MHz范围内,在22 GHz时的集成抖动为61.23 fs,并伴有- 253.0 dB的品质因数(FoM)和0.057 mm2的小核心面积。测试结果验证了所提出的增益和带宽控制方案的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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