A Blocker-Tolerant Non-Uniform Sub-Sampling Receiver With a Non-Uniform Discrete-Time FIR Filter

IF 4.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-11-11 DOI:10.1109/JSSC.2024.3470911
Mostafa Ayesh;Soumya Mahapatra;Ce Yang;Mike Shuo-Wei Chen
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Abstract

A non-uniform (NU) sub-sampling receiver (RX) with a NU discrete-time FIR (NU DT FIR) filter can create multiple tunable frequency notches both near and far from the passband via predesigned NU sampling clocks and filter coefficients. NU DT finite impulse response (FIR) acts as an anti-aliasing (AA) filter for a nonuniformly sampled signal which relaxes the subsequent ADC speed and dynamic range (DR). To save power and area and to improve linearity, the FIR filter is implemented in the current domain and shares the capacitive DAC with a subsequent asynchronous SAR ADC. A proof-of-concept NU DT FIR RX is implemented in 28 nm CMOS. It achieves up to 42 dB of blocker rejection with B1dB of 4 dBm. The receiver measures −27.4 dB EVM for a 64-QAM 100 MSymbol/s signal centered at 20 GHz in the presence of a 10-dBc blocker. The end-to-end RX consumes 24 mW from a 1-V supply and occupies an active area of 0.072 mm2.
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带有非均匀离散时间 FIR 滤波器的耐阻塞非均匀子采样接收器
带有非均匀(NU)离散时间 FIR(NU DT FIR)滤波器的非均匀(NU)子采样接收器(RX)可通过预先设计的非均匀采样时钟和滤波器系数,在通带附近和远处创建多个可调频率缺口。NU DT 有限脉冲响应 (FIR) 可作为非均匀采样信号的抗锯齿 (AA) 滤波器,从而放宽后续 ADC 速度和动态范围 (DR)。为了节省功耗和面积并提高线性度,FIR 滤波器在电流域中实现,并与随后的异步 SAR ADC 共享电容式 DAC。28 纳米 CMOS 实现了概念验证 NU DT FIR RX。它的阻塞抑制高达 42 dB,B1dB 为 4 dBm。在存在 10 dBc 遮挡器的情况下,接收器对以 20 GHz 为中心的 64-QAM 100 MSymbol/s 信号的 EVM 测量为 -27.4 dB。端到端 RX 的 1 V 电源功耗为 24 mW,占用的有效面积为 0.072 mm2。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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