Nanosecond Transient Validation of Surge Arrester Models to Predict Electromagnetic Pulse Response

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-11-12 DOI:10.1109/TEMC.2024.3486980
Tyler C. Bowman;Thomas Kmieciak;Laura B. Biedermann
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Abstract

The impact of high-altitude electromagnetic pulse events on the electric grid is not fully understood, and validated modeling of mitigations, such as lightning surge arresters (LSAs) is necessary to predict the propagation of very fast transients on the grid. Experimental validation of high frequency models for surge arresters is an active area of research. This article serves to experimentally validate a previously defined ZnO LSA model using four metal-oxide varistor pucks and nanosecond scale pulses to measure voltage and current responses. The SPICE circuit models of the pucks showed good predictability when compared to the measured arrester response when accounting for a testbed inductance of approximately 100 nH. Additionally, the comparatively high capacitance of low-profile arresters show a favorable response to high-speed transients that indicates the potential for effective electromagnetic pulse mitigation with future materials design.
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纳秒瞬态验证避雷器模型以预测电磁脉冲响应
高空电磁脉冲事件对电网的影响尚不完全清楚,因此有必要对雷击避雷器(LSAs)等缓解措施进行验证建模,以预测极快瞬态在电网上的传播。高频避雷器模型的实验验证是一个活跃的研究领域。本文通过实验验证了先前定义的氧化锌LSA模型,该模型使用四个金属氧化物压敏电阻和纳秒级脉冲来测量电压和电流响应。当考虑到试验台电感约为100 nH时,与测量的避雷器响应相比,pucks的SPICE电路模型显示出良好的可预测性。此外,相对高电容的低轮廓避雷器显示出对高速瞬变的良好响应,这表明了未来材料设计有效减缓电磁脉冲的潜力。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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