{"title":"A Novel Crosstalk Suppression Method for SiC MOSFET Discrete Device With Crosstalk Type Determination","authors":"Han Peng;Qing Xin;Qiaozhi Yue;Yong Kang","doi":"10.1109/TIE.2024.3488284","DOIUrl":null,"url":null,"abstract":"The fast switching speed of silicon carbide (SiC) metal oxide semiconductor field effect transistor (MOSFET) leads to serious crosstalk problems in half bridge structures. State-of-the-art crosstalk suppression methods have the following limitations: crosstalk caused by common source inductance is ignored; crosstalk is not correctly reflected by external gate source voltage sampling. To overcome above defects, this letter proposes a novel crosstalk suppression method to suppress the crosstalk caused by miller capacitance and common source inductance through automatic switching of loop impedance and drive voltage. In addition, the proposed method can correctly determine the crosstalk type based on the internal gate source voltage detection. Experimental results show that the crosstalk voltage under the proposed method can be reduced by 21.36% and 49.15% during turn-<sc>on</small> transient and 27.78% and 76.56% during turn-<sc>off</small> transient at 800 V/60 A compared with no crosstalk suppression and with only active miller clamp.","PeriodicalId":13402,"journal":{"name":"IEEE Transactions on Industrial Electronics","volume":"72 6","pages":"6559-6563"},"PeriodicalIF":7.2000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Industrial Electronics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10752836/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
The fast switching speed of silicon carbide (SiC) metal oxide semiconductor field effect transistor (MOSFET) leads to serious crosstalk problems in half bridge structures. State-of-the-art crosstalk suppression methods have the following limitations: crosstalk caused by common source inductance is ignored; crosstalk is not correctly reflected by external gate source voltage sampling. To overcome above defects, this letter proposes a novel crosstalk suppression method to suppress the crosstalk caused by miller capacitance and common source inductance through automatic switching of loop impedance and drive voltage. In addition, the proposed method can correctly determine the crosstalk type based on the internal gate source voltage detection. Experimental results show that the crosstalk voltage under the proposed method can be reduced by 21.36% and 49.15% during turn-on transient and 27.78% and 76.56% during turn-off transient at 800 V/60 A compared with no crosstalk suppression and with only active miller clamp.
期刊介绍:
Journal Name: IEEE Transactions on Industrial Electronics
Publication Frequency: Monthly
Scope:
The scope of IEEE Transactions on Industrial Electronics encompasses the following areas:
Applications of electronics, controls, and communications in industrial and manufacturing systems and processes.
Power electronics and drive control techniques.
System control and signal processing.
Fault detection and diagnosis.
Power systems.
Instrumentation, measurement, and testing.
Modeling and simulation.
Motion control.
Robotics.
Sensors and actuators.
Implementation of neural networks, fuzzy logic, and artificial intelligence in industrial systems.
Factory automation.
Communication and computer networks.