Baptiste Le Bellego , Vincent Motto-Ros , Béatrice Luais , Cécile Fabre , Célia Dalou , Pierre Condamine , Laurent Tissandier
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引用次数: 0
Abstract
Understanding the distribution of elements between the cores and mantles of planetary bodies is essential for elucidating the geological and geochemical processes operating during their formation. Because the semi-metallic element Ge shows complex siderophile, chalcophile, and lithophile properties, it is particularly significant for investigating core–mantle segregation and ore deposit formation. Recent advancements in in situ microanalysis techniques, such as μLIBS, have enabled high-resolution elemental mapping of Ge and other trace elements.
This study explores the application of μLIBS imaging to investigate the high-temperature/high-pressure distribution of Ge between metallic and silicate matrices analogous to planetary cores and mantles. By cross-calibrating the μLIBS intensities with electron microprobe profile analyses carried out on piston cylinder experimental samples, we produced semi-quantitative Ge maps from which we extracted Ge concentration profiles to assess Ge diffusion from the silicate to the metal. We determined, for the first time, the diffusion coefficient of Ge between metal and silicate to be D(Ge)metal = 4.03E−13 ± 3.6E−14 m2/s at 1 GPa and 1350 °C. Our results demonstrate the capability and efficiency of μLIBS for providing detailed, high-resolution (15 μm) trace element concentration data at few ppm levels, offering a time- and cost-effective alternative to conventional techniques.
These findings bring insights on planetesimal differentiation and on chemical exchanges between metal and silicate phases in a magma ocean and between two different metal phases occurring at the bottom of the magma ocean during planetesimal formation.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.