Jun Zhao , Wuqian Li , Shiwei Chen , YeShen Lan , Marian Wiercigroch , Zixuan Wang , Ji Zhao
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引用次数: 0
Abstract
Gallium nitride (GaN) is an important third-generation semiconductor material. However, due to its high hardness, high brittleness and anisotropy, the material removal efficiency of GaN during ultraprecision machining is low, and subsurface damage easily occurs. In order to achieve high-efficiency and low-damage ultra-precision machining, the model of double nanoscratches is innovatively utilized to investigate the mechanical behavioral of GaN at the atomic scale. Specifically, double nanoscratches experiments and corresponding molecular dynamics (MD) simulations were carried out on GaN (0001) crystal plane along the and crystal directions to reveal the material removal, deformation and subsurface damage mechanisms of GaN under anisotropic conditions. The results show that the plastic removal of GaN can be realized by setting loading force and scratch spacing. Scratching along the crystal direction has a greater ductile-brittle transition load force than the crystal direction. MD analysis shows that the downward-extending prismatic slip produced by scratching along the crystal direction is the cause of crack extension to the subsurface during the experiment. As the load force increases, the surface cracks of the double scratches expand and intersect, inducing streak-like brittle fracture. The significant increase in the lateral force of the second scratch is the main reason for the brittle fracture in the double scratch experiment. After the double nanoscratches experiment, the damage presented on the GaN subsurface mainly includes atomic scale damage such as amorphization, stacked laminations, polycrystalline nanoscratch, and phase transition. The Stacking fault bands around the damage zone inhibit the damage extension. The second scratch generates a large number of dislocations in the overlap zone and attenuates the subsurface amorphization under the influence of dislocation strengthening effect.
氮化镓(GaN)是一种重要的第三代半导体材料。然而,由于氮化镓的高硬度、高脆性和各向异性,其在超精密加工过程中的材料去除效率较低,且易发生次表面损伤。为了实现高效率、低损伤的超精密加工,我们创新性地利用双纳米划痕模型来研究氮化镓在原子尺度上的力学行为。具体而言,在氮化镓(0001)晶面上沿[101¯0]和[12¯10]晶向进行了双纳米划痕实验和相应的分子动力学(MD)模拟,揭示了各向异性条件下氮化镓的材料去除、变形和次表面损伤机制。结果表明,通过设置加载力和划痕间距可以实现 GaN 的塑性去除。沿[12¯10]晶向的划痕比沿[101¯0]晶向的划痕具有更大的韧性-脆性转变载荷力。MD 分析表明,沿[101¯0]晶向划痕产生的向下延伸的棱柱滑移是实验中裂纹向次表层延伸的原因。随着载荷力的增加,双划痕的表面裂纹扩展并相交,诱发条纹状脆性断裂。在双划痕实验中,第二道划痕的横向力明显增大,这是导致脆性断裂的主要原因。在双纳米划痕实验后,GaN 亚表面呈现的损伤主要包括原子尺度的损伤,如非晶化、叠层、多晶纳米划痕和相变。损伤区周围的堆叠断层带抑制了损伤的扩展。第二次划痕会在重叠区产生大量位错,并在位错强化效应的影响下减弱次表层的非晶化。
期刊介绍:
The International Journal of Mechanical Sciences (IJMS) serves as a global platform for the publication and dissemination of original research that contributes to a deeper scientific understanding of the fundamental disciplines within mechanical, civil, and material engineering.
The primary focus of IJMS is to showcase innovative and ground-breaking work that utilizes analytical and computational modeling techniques, such as Finite Element Method (FEM), Boundary Element Method (BEM), and mesh-free methods, among others. These modeling methods are applied to diverse fields including rigid-body mechanics (e.g., dynamics, vibration, stability), structural mechanics, metal forming, advanced materials (e.g., metals, composites, cellular, smart) behavior and applications, impact mechanics, strain localization, and other nonlinear effects (e.g., large deflections, plasticity, fracture).
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