In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching

Abstract

The advancement in grazing incidence X-ray scattering (GIWAXS) techniques at synchrotron radiation facilities has significantly deepened our understanding of semiconducting polymers. However, investigation of ultrathin polymer films under tensile conditions poses challenge, primarily due to limitations associated with the lack of suitable sample preparation methods and new stretching devices. This study addresses these limitations by designing and developing an in-situ temperature-controllable stretching sample stage, which enables real-time structural measurements of ultrathin polymer films at Beijing Synchrotron Radiation Facility. In particular, we report, for the first time, in-situ GIWAXS results of representative semiconducting polymer thin films under variable-temperature stretching. This research has overcome the limitations imposed by sample constraints, thus facilitating the achievement of valuable insights into the behavior of ultrathin polymer films under tensile conditions. Distinct changes in the molecular ordering and packing within the polymer thin films as a result of increasing applied strain and temperature have been uncovered. This study promotes future developments in the field, thus enabling the design and optimization of intrinsically stretchable electronic devices and other technologically relevant applications.