Design-Agnostic Distributed Timing Fault Injection Monitor With End-to-End Design Automation

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-12-04 DOI:10.1109/JSSC.2024.3504546
Yan He;Yumin Su;Kaiyuan Yang
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Abstract

Fault injection attacks (FIAs) induce hardware failures in circuits and exploit these faults to compromise the security of the system. It has been demonstrated that FIAs can bypass system security mechanisms, cause faulty outputs, and gain access to secret information. Certain types of FIAs can be mounted with little effort by tampering with clock signals and/or the chip’s operating conditions. To mitigate such low-cost, yet powerful attacks, we propose a fully synthesizable and distributable in situ fault injection monitor that employs a delay locked loop (DLL) to track the pulsewidth of the clock. We further develop a fully automated design framework to optimize and implement the FIA monitors at any process node. Our design is fabricated and verified in 65-nm CMOS technology with a small footprint of $1500~{\mu }$ m2. It can lock to clock frequencies from 2 MHz to 1.26 GHz while detecting all 12 types of possible clock glitches, as well as timing FIA injections via the supply voltage, electromagnetic (EM) signals, and chip temperature.
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具有端到端设计自动化的设计不可知分布式定时故障注入监视器
故障注入攻击(FIAs)是指在电路中引起硬件故障,并利用这些故障危害系统的安全性。已经证明FIAs可以绕过系统安全机制,导致错误输出,并获得秘密信息。通过篡改时钟信号和/或芯片的操作条件,可以轻松安装某些类型的FIAs。为了减轻这种低成本但强大的攻击,我们提出了一种完全可合成和可分布的原位故障注入监测器,该监测器采用延迟锁定环(DLL)来跟踪时钟的脉宽。我们进一步开发了一个完全自动化的设计框架,以在任何过程节点上优化和实现FIA监控器。我们的设计是在65纳米CMOS技术上制造和验证的,占地面积很小,为1500~{\mu}$ m2。它可以锁定在2 MHz至1.26 GHz的时钟频率范围内,同时检测所有12种可能的时钟故障,并通过电源电压、电磁(EM)信号和芯片温度对FIA注入进行定时。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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