Effect of a Longitudinal Aperture's Position Uncertainty on the Electromagnetic Fields Excited in a Finite Length Cylindrical Cavity

IF 2.6 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-09 DOI:10.1109/TEMC.2024.3506623
Secil E. Dogan;Joel T. Johnson;Robert J. Burkholder
{"title":"Effect of a Longitudinal Aperture's Position Uncertainty on the Electromagnetic Fields Excited in a Finite Length Cylindrical Cavity","authors":"Secil E. Dogan;Joel T. Johnson;Robert J. Burkholder","doi":"10.1109/TEMC.2024.3506623","DOIUrl":null,"url":null,"abstract":"The effect of a longitudinal aperture's location on the electromagnetic modal fields excited in a finite-length cylindrical cavity by plane wave incidence is investigated using a semi-analytical approach. Insights from this analysis are then used to obtain statistical descriptions of the cavity's individual modes and quality factor for a stochastically described aperture location. An analytical model for the probability density function of these quantities is also derived and validated through comparisons with Monte Carlo simulations.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 1","pages":"149-157"},"PeriodicalIF":2.6000,"publicationDate":"2024-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10783423/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

The effect of a longitudinal aperture's location on the electromagnetic modal fields excited in a finite-length cylindrical cavity by plane wave incidence is investigated using a semi-analytical approach. Insights from this analysis are then used to obtain statistical descriptions of the cavity's individual modes and quality factor for a stochastically described aperture location. An analytical model for the probability density function of these quantities is also derived and validated through comparisons with Monte Carlo simulations.
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纵向孔径位置不确定性对有限长圆柱腔内电磁场的影响
采用半解析方法研究了纵向孔径位置对有限长圆柱腔内平面波入射激发电磁场的影响。从这个分析的见解,然后用于获得腔的单个模式的统计描述和随机描述的孔径位置的质量因子。本文还推导了这些量的概率密度函数的解析模型,并通过与蒙特卡罗模拟的比较进行了验证。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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