A Slot-Type Ez Probe With a Lower Effective Center

IF 2.5 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electromagnetic Compatibility Pub Date : 2024-12-11 DOI:10.1109/TEMC.2024.3503725
Yu Tian;Xing-Chang Wei;Di Wang;Richard Xian-Ke Gao
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Abstract

This article introduces a novel slot-type Ez probe engineered to achieve a lower effective center. This innovation addresses the limitation inherent in traditional Ez probes, which have a higher effective center and consequently suffer from low spatial resolution. The proposed probe incorporates a slot structure in its detection part, greatly lowering its effective center. Through simulation optimization, the slot structure is carefully designed to strike a balance between a high sensitivity and low effective center. To further elucidate the working principle of the slot probe, this article examines the effect of the probe's geometry on the effective center. The probe's design on a four-layer printed circuit board enables cost-effective fabrication without compromising stable performance. Operating within a frequency range of up to 30 GHz, the probe also effectively suppresses unwanted fields across a wide spectrum. Both simulation and measurement results corroborate the exceptional performance of the proposed probe, validating its efficacy in practical applications.
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低有效中心槽型Ez探针
本文介绍了一种新型的槽型Ez探针,用于实现较低的有效中心。这一创新解决了传统Ez探针固有的局限性,即具有较高的有效中心,因此受到低空间分辨率的影响。该探头在其探测部分采用了凹槽结构,大大降低了其有效中心。通过仿真优化,精心设计了槽结构,在高灵敏度和低有效中心之间取得了平衡。为了进一步阐明槽式测头的工作原理,本文考察了测头几何形状对有效中心的影响。探头在四层印刷电路板上的设计使制造具有成本效益,而不会影响稳定的性能。在高达30 GHz的频率范围内工作,探头还有效地抑制了广谱范围内不需要的场。仿真和测量结果都证实了所提出的探针的卓越性能,验证了其在实际应用中的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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