{"title":"A 2.72-fJ/Conversion-Step 13-bit SAR ADC With Wide Common-Mode Complementary Split Pre-Amplifier Comparator and Grounded-Finger CDAC","authors":"Sewon Lee;Hyein Kang;Minjae Lee","doi":"10.1109/JSSC.2024.3510883","DOIUrl":null,"url":null,"abstract":"This article presents a compact 13-bit 2-MS/s successive approximation register (SAR) analog-to-digital converter (ADC) designed to enhance energy efficiency under various comparator input common-mode voltage scenarios. The proposed comparator structure features a complementary split pre-amplifier to extend the input common-mode range, resulting in an SNDR drop of approximately 1 dB even at a near 0-V ADC input common-mode voltage of 0.038 V. Furthermore, the proposed grounded-finger capacitive digital-to-analog converter (CDAC) reduces the impact of hard-to-scale fringe capacitance with a regular structure in order to reduce the number of CDAC elements and area. Utilizing these techniques, the prototype SAR ADC implemented in a 65-nm CMOS LP process achieves an uncalibrated integral non-linearity (INL) of 1.07 LSB, an 87.4% reduction in elements, and 70.6-dB SNDR in a 0.0372 mm2, consuming only <inline-formula> <tex-math>$15.1~{\\mu }$ </tex-math></inline-formula> W at 0.75 V that results in a Walden figure of merit (FoMW) of 2.72 fJ/conversion-step.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 7","pages":"2558-2567"},"PeriodicalIF":5.6000,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10792657/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article presents a compact 13-bit 2-MS/s successive approximation register (SAR) analog-to-digital converter (ADC) designed to enhance energy efficiency under various comparator input common-mode voltage scenarios. The proposed comparator structure features a complementary split pre-amplifier to extend the input common-mode range, resulting in an SNDR drop of approximately 1 dB even at a near 0-V ADC input common-mode voltage of 0.038 V. Furthermore, the proposed grounded-finger capacitive digital-to-analog converter (CDAC) reduces the impact of hard-to-scale fringe capacitance with a regular structure in order to reduce the number of CDAC elements and area. Utilizing these techniques, the prototype SAR ADC implemented in a 65-nm CMOS LP process achieves an uncalibrated integral non-linearity (INL) of 1.07 LSB, an 87.4% reduction in elements, and 70.6-dB SNDR in a 0.0372 mm2, consuming only $15.1~{\mu }$ W at 0.75 V that results in a Walden figure of merit (FoMW) of 2.72 fJ/conversion-step.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.