A 2.72-fJ/Conversion-Step 13-bit SAR ADC With Wide Common-Mode Complementary Split Pre-Amplifier Comparator and Grounded-Finger CDAC

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-12-11 DOI:10.1109/JSSC.2024.3510883
Sewon Lee;Hyein Kang;Minjae Lee
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Abstract

This article presents a compact 13-bit 2-MS/s successive approximation register (SAR) analog-to-digital converter (ADC) designed to enhance energy efficiency under various comparator input common-mode voltage scenarios. The proposed comparator structure features a complementary split pre-amplifier to extend the input common-mode range, resulting in an SNDR drop of approximately 1 dB even at a near 0-V ADC input common-mode voltage of 0.038 V. Furthermore, the proposed grounded-finger capacitive digital-to-analog converter (CDAC) reduces the impact of hard-to-scale fringe capacitance with a regular structure in order to reduce the number of CDAC elements and area. Utilizing these techniques, the prototype SAR ADC implemented in a 65-nm CMOS LP process achieves an uncalibrated integral non-linearity (INL) of 1.07 LSB, an 87.4% reduction in elements, and 70.6-dB SNDR in a 0.0372 mm2, consuming only $15.1~{\mu }$ W at 0.75 V that results in a Walden figure of merit (FoMW) of 2.72 fJ/conversion-step.
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一个2.72 fj /转换步长13位SAR ADC,具有宽共模互补分裂前置放大器比较器和接地手指CDAC
本文提出了一种紧凑的13位2 ms /s逐次逼近寄存器(SAR)模数转换器(ADC),旨在提高各种比较器输入共模电压情况下的能效。所提出的比较器结构具有一个互补的分路前置放大器,以扩展输入共模范围,即使在接近0-V的ADC输入共模电压为0.038 V时,SNDR也会下降约1 dB。此外,本文提出的接地指式电容式数模转换器(CDAC)以规则的结构减少了难以标度的条纹电容的影响,从而减少了CDAC元件的数量和面积。利用这些技术,在65纳米CMOS LP工艺中实现的原型SAR ADC实现了1.07 LSB的未校准积分非线性(INL),元件减少了87.4%,在0.0372 mm2内实现了70.6 db的SNDR,在0.75 V下仅消耗15.1~{\mu}$ W,导致瓦尔登品质系数(FoMW)为2.72 fJ/转换步。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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