A 0.38-mW 200-kHz-BW Digital-Intensive Single-Opamp Fourth-Order Continuous-Time Delta-Sigma Modulator With Third-Order Digital Noise Coupling in 28-nm CMOS
Kent Edrian Lozada;Ye-Dam Kim;Ho-Jin Kim;Youngjae Cho;Michael Choi;Seung-Tak Ryu
{"title":"A 0.38-mW 200-kHz-BW Digital-Intensive Single-Opamp Fourth-Order Continuous-Time Delta-Sigma Modulator With Third-Order Digital Noise Coupling in 28-nm CMOS","authors":"Kent Edrian Lozada;Ye-Dam Kim;Ho-Jin Kim;Youngjae Cho;Michael Choi;Seung-Tak Ryu","doi":"10.1109/JSSC.2024.3513442","DOIUrl":null,"url":null,"abstract":"This article presents a digital-intensive, single-opamp, 4th-order continuous-time delta-sigma modulator (CT DSM) architecture with a simple and low-power 3rd-order digital noise-coupling (DNC) assisted by a successive approximation register (SAR). To address the limited maximum stable amplitude (MSA) issue in high-order noise coupling, a digital back-end integrator is adopted to suppress the large input signal at the quantizer’s input, achieving an MSA of −1.6 dBFS even with aggressive noise shaping in a single-loop design. A digital adder-free 3rd-order DNC filter is introduced, which performs the addition directly in the charge domain using the capacitor digital-to-analog converter (DAC) in the SAR quantizer. Fabricated in 28-nm CMOS, the prototype demonstrates that a high-order CT DSM can be realized with a reduced analog burden by shifting most of the signal processing of the loop filter (LF) to the digital domain. It achieves a peak signal-to-noise and distortion ratio (SNDR), signal-to-noise ratio (SNR), and dynamic range (DR) of 89.0, 89.2, and 92.1 dB, respectively, across a 200-kHz bandwidth while consuming only 0.38 mW from a 1.1-V supply. The Schreier figure of merit (FoM) is 179.3 dB, and the Walden FoM is 41.2 fJ/conv.-step.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"1236-1247"},"PeriodicalIF":5.6000,"publicationDate":"2024-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10804627/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article presents a digital-intensive, single-opamp, 4th-order continuous-time delta-sigma modulator (CT DSM) architecture with a simple and low-power 3rd-order digital noise-coupling (DNC) assisted by a successive approximation register (SAR). To address the limited maximum stable amplitude (MSA) issue in high-order noise coupling, a digital back-end integrator is adopted to suppress the large input signal at the quantizer’s input, achieving an MSA of −1.6 dBFS even with aggressive noise shaping in a single-loop design. A digital adder-free 3rd-order DNC filter is introduced, which performs the addition directly in the charge domain using the capacitor digital-to-analog converter (DAC) in the SAR quantizer. Fabricated in 28-nm CMOS, the prototype demonstrates that a high-order CT DSM can be realized with a reduced analog burden by shifting most of the signal processing of the loop filter (LF) to the digital domain. It achieves a peak signal-to-noise and distortion ratio (SNDR), signal-to-noise ratio (SNR), and dynamic range (DR) of 89.0, 89.2, and 92.1 dB, respectively, across a 200-kHz bandwidth while consuming only 0.38 mW from a 1.1-V supply. The Schreier figure of merit (FoM) is 179.3 dB, and the Walden FoM is 41.2 fJ/conv.-step.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.