A Single-Input RF Energy-Harvesting Interface With Compensated-CEPE Control and 3-D Hill-Climbing MPPT Achieving −28.5-dBm Sensitivity

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-12-18 DOI:10.1109/JSSC.2024.3516117
Qiujin Chen;Tian Xia;Tingxu Hu;Yuanfei Wang;Yan Lu;Rui P. Martins;Mo Huang
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Abstract

This work presents a single-input radio frequency energy-harvesting (RFEH) interface with 3-D hill-climbing (HC) maximum power point tracking (MPPT). We use constant energy packet extraction (CEPE) control that facilitates power detection with low quiescent current. To reduce the error of the CEPE scheme at a low-voltage conversion ratio (VCR), we modify it with turn-on time compensation. We obtain the 3-D MPPT by searching the optimal: 1) the number of rectifier stages; 2) dc-dc input impedance; and 3) rectifier shunt input capacitance. Furthermore, we replace the RF circuit with an artificial neural network (ANN) model to speed up the simulation. The prototype chip for the 2.4-GHz RFEH interface fabricated in a 65-nm CMOS exhibits >97% MPPT accuracy. The low-power design facilitates the highest sensitivity (−28.5 dBm) and efficiency (10.4% at −20-dBm $P_{\mathrm { IN}}$ ) among the compared works with single-input rectifiers. In addition, it shows near-consistent efficiency across varying temperatures.
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具有补偿-CEPE 控制和三维爬坡 MPPT 功能的单输入射频能量收集接口,灵敏度可达 28.5 dBm 美元
这项工作提出了一个单输入射频能量收集(RFEH)接口,具有3-D爬坡(HC)最大功率点跟踪(MPPT)。我们使用恒定能量包提取(CEPE)控制,便于低静态电流的功率检测。为了减少低电压转换比(VCR)下的cep方案误差,我们对其进行了导通时间补偿。通过寻找最优的整流级数,得到了三维最优MPPT;2) dc-dc输入阻抗;3)整流并联输入电容。此外,我们用人工神经网络(ANN)模型代替射频电路以加快仿真速度。采用65纳米CMOS工艺制作的2.4 ghz RFEH接口原型芯片的MPPT精度达到了97%。低功耗设计使其灵敏度(−28.5 dBm)和效率(−20 dBm $P_{\ maththrm {IN}}$)在单输入整流器的比较作品中最高。此外,它在不同温度下显示出几乎一致的效率。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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