A HIE S-FDTD Method to Account for Geometrical and Material Uncertainties in Lossy Thin Panels

Abstract

This article introduces an extended stochastic finite-difference time-domain (S-FDTD) method tailored to analyze thin panel structures. It aims to predict the standard deviation and probability density function (pdf) of electromagnetic magnitudes (fields and currents), assuming their uncertainties in geometrical and material parameters are both known. The method to account for the sub-cell nature of the thin panel method used is based on the broadly tested subgridding boundary condition (SGBC) approach. This method employs an hybrid implicit-explicit (HIE) scheme in an unconditional Crank-Nicolson (CN) formulation (CN-SGBC), ensuring that it does not introduce any extra limitations to the standard stability criterion of the finite difference time domain (FDTD) method. In the article, classical models of explicit formulations of S-FDTD are extended to the CN-SGBC HIE formulation.