Direct Photo-Crosslinking Patterning for High-Performance 0D–2D Hybrid Photodetectors

Abstract

High-performance 0D–2D hybrid photodetectors integrated with a crosslinker for direct pattering of quantum dots on the large-scale synthesized MoS₂ layer are reported. In the patterned hybrid structure, QD layers are patterned with a resolution of up to 2 µm, ensuring high precision. Enhanced charge transfer from QDs to 2D materials is confirmed using PL quenching, TR-PL, and UPS analysis. As a result, the QD/2D hybrid photodetectors with crosslinker-assisted direct patterning demonstrated a remarkable photoresponsivity of ≈10⁵ A W⁻¹ and a specific detectivity of over 10¹¹ Jones, attributed to the difference in built-in potential. The crosslinker patterning of QDs opens up potential applications for the photodetectors in highly integrated image sensors and can be further extended to high-resolution display industries, eliminating unnecessary fabrication processes.