Front Cover: Laser Beam Induced Charge Collection for Defect Mapping and Spin State Readout in Diamond (Adv. Quantum Technol. 12/2024)

Abstract

Photocurrents in wide bandgap materials provide valuable insights into the dynamics of intrinsic defects. In article number 2400237, Ralf Wunderlich and co-workers use a commercially available charge integrator IC with switchable input on a printed circuit board (cover image) for low-noise current measurements with a resolution of about 100 fA. Thus, the authors can image and detect small numbers of individual defects in ultrapure diamond. Furthermore, the authors conduct photocurrent-detected magnetic resonance (PDMR) on NV centers. The work paves the way for low-cost, miniaturized, simple and time-resolved photocurrent measurements of solid-state defects.