A 52-Gb/s Low-Power PAM-4 Baud-Rate CDR Using Pattern-Based Phase Detector for Short-Reach Applications

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-12-24 DOI:10.1109/JSSC.2024.3517841
Seungwoo Park;Yoonjae Choi;Jincheol Sim;Jonghyuck Choi;Hyunsu Park;Youngwook Kwon;Changmin Sim;Seongcheol Kim;Chulwoo Kim
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Abstract

A four-level pulse amplitude modulation (PAM-4) baud-rate clock and data recovery (CDR) is proposed for a power-efficient receiver. The baud-rate CDR reduces the burden of multi-phase clock generation and distribution, thus reducing the power consumption of clocking circuits. A pattern-based phase detector (PBPD) is proposed in the clock recovery path to address the transition density (TD) reduction caused by the baud-rate operation. The PBPD optimizes patterns that provide phase information, increasing TD by $4{\times }$ compared with the conventional baud-rate PD, Mueller-Müller phase detector (MMPD). In addition, the number of comparators required for data recovery is reduced by one per unit interval (UI) by sharing the comparators used for CDR. The CDR prototype fabricated using a 28-nm CMOS is verified using PRBS31 pattern, where a bit error ratio less than 3e-8 is achieved under 5.6-dB channel loss at 0.83-pJ/b energy efficiency while occupying only 0.011 mm2.
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基于模式鉴相器的52 gb /s低功耗PAM-4波特率话单
提出了一种四电平脉冲调幅(PAM-4)波特率时钟和数据恢复(CDR)的节能接收机。波特率话单减轻了多相时钟产生和分配的负担,从而降低了时钟电路的功耗。在时钟恢复路径中提出了一种基于模式的鉴相器(PBPD),以解决波特率操作导致的跃迁密度(TD)降低的问题。PBPD优化了提供相位信息的模式,与传统波特率PD, mueller - MMPD (MMPD)相比,TD增加了4美元。此外,通过共享用于CDR的比较器,数据恢复所需的比较器数量每单位间隔(UI)减少一个。采用PRBS31模式验证了采用28纳米CMOS制作的CDR原型,在5.6 db信道损耗下,以0.83 pj /b的能量效率实现了小于3e-8的误码率,而占地面积仅为0.011 mm2。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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