Claudio Nani;Enrico Monaco;Nicola Ghittori;Alessandro Bosi;Domenico Albano;Claudio Asero;Nicola Codega;Alessio Di Pasquo;Ivan Fabiano;Marco Garampazzi;Fabio Giunco;Leonardo Daniel Herbas Burgos;Gabriele Minoia;Paolo Rossi;Marco Sosio;Leonardo Vignoli;Enrico Temporiti;Shawn Scouten;Stephen Jantzi
{"title":"A 5-nm 60-GS/s 7b 64-Way Time Interleaved Partial Loop Unrolled SAR ADC Achieving 35.2dB SNDR up to 32 GHz","authors":"Claudio Nani;Enrico Monaco;Nicola Ghittori;Alessandro Bosi;Domenico Albano;Claudio Asero;Nicola Codega;Alessio Di Pasquo;Ivan Fabiano;Marco Garampazzi;Fabio Giunco;Leonardo Daniel Herbas Burgos;Gabriele Minoia;Paolo Rossi;Marco Sosio;Leonardo Vignoli;Enrico Temporiti;Shawn Scouten;Stephen Jantzi","doi":"10.1109/JSSC.2024.3517333","DOIUrl":null,"url":null,"abstract":"A 60-GS/s 7b 64-way time interleaved (TI) analog-to-digital converter (ADC) with analog front end (AFE) is described. The presented converter features a non-binary partial loop unrolled (LU) SAR SubADC architecture that leverages multiple comparators, thus enabling better tradeoff between noise and power compared to conventional SAR. Offsets mismatches among comparators of each SubADC are calibrated in background by detecting patterns in the SAR output decisions. This results in no need for any analog hardware reconfigurability or additional phase overhead. Fabricated in 5-nm technology, the prototype AFE and ADC deliver 35.5 and 35.2dB signal to noise and distortion ratio (SNDR) till 20 and 32 GHz, respectively, and draw 109.3 mW from 0.9 V supply.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"1210-1222"},"PeriodicalIF":5.6000,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10816650/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A 60-GS/s 7b 64-way time interleaved (TI) analog-to-digital converter (ADC) with analog front end (AFE) is described. The presented converter features a non-binary partial loop unrolled (LU) SAR SubADC architecture that leverages multiple comparators, thus enabling better tradeoff between noise and power compared to conventional SAR. Offsets mismatches among comparators of each SubADC are calibrated in background by detecting patterns in the SAR output decisions. This results in no need for any analog hardware reconfigurability or additional phase overhead. Fabricated in 5-nm technology, the prototype AFE and ADC deliver 35.5 and 35.2dB signal to noise and distortion ratio (SNDR) till 20 and 32 GHz, respectively, and draw 109.3 mW from 0.9 V supply.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.