A 5-nm 60-GS/s 7b 64-Way Time Interleaved Partial Loop Unrolled SAR ADC Achieving 35.2dB SNDR up to 32 GHz

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-12-27 DOI:10.1109/JSSC.2024.3517333
Claudio Nani;Enrico Monaco;Nicola Ghittori;Alessandro Bosi;Domenico Albano;Claudio Asero;Nicola Codega;Alessio Di Pasquo;Ivan Fabiano;Marco Garampazzi;Fabio Giunco;Leonardo Daniel Herbas Burgos;Gabriele Minoia;Paolo Rossi;Marco Sosio;Leonardo Vignoli;Enrico Temporiti;Shawn Scouten;Stephen Jantzi
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Abstract

A 60-GS/s 7b 64-way time interleaved (TI) analog-to-digital converter (ADC) with analog front end (AFE) is described. The presented converter features a non-binary partial loop unrolled (LU) SAR SubADC architecture that leverages multiple comparators, thus enabling better tradeoff between noise and power compared to conventional SAR. Offsets mismatches among comparators of each SubADC are calibrated in background by detecting patterns in the SAR output decisions. This results in no need for any analog hardware reconfigurability or additional phase overhead. Fabricated in 5-nm technology, the prototype AFE and ADC deliver 35.5 and 35.2dB signal to noise and distortion ratio (SNDR) till 20 and 32 GHz, respectively, and draw 109.3 mW from 0.9 V supply.
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5nm 60-GS/s 7b 64路时间交错部分环路展开SAR ADC,实现35.2dB信噪比高达32 GHz
介绍了一种具有模拟前端(AFE)的60-GS/s 7b 64路时间交错(TI)模数转换器(ADC)。所提出的转换器具有非二进制部分环路展开(LU) SAR SubADC架构,利用多个比较器,因此与传统SAR相比,能够更好地在噪声和功率之间进行权衡。通过检测SAR输出决策中的模式,在背景中校准每个SubADC的比较器之间的偏置不匹配。这导致不需要任何模拟硬件可重构性或额外的相位开销。原型AFE和ADC采用5nm技术制造,在20 GHz和32 GHz时分别提供35.5和35.2dB的信噪比和失真比(SNDR),并在0.9 V电源下消耗109.3 mW。
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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