{"title":"A 0.5-V 125-MHz 256-Kb 22-nm SRAM With 10-aJ/bit Active Energy and 10-pW/bit Shutdown Power","authors":"Jinn-Shyan Wang;Chien-Tung Liu;Yu-Chuan Hou","doi":"10.1109/JSSC.2024.3520631","DOIUrl":null,"url":null,"abstract":"Conventional low-voltage (LV) static random access memories (SRAMs) utilizing separate read-and-write assist circuits sacrifice access speed too much, leading to poor energy efficiency. Overlaying additional assist circuits to enable power-saving modes can exacerbate speed loss and energy inefficiency. This work proposes a coordinated read-write-hold-retention-shutdown (SD) assist circuit design for SRAMs to improve speed at low VDD and reduce leakage current in active and power-saving modes. This leads to overall power reduction and enhanced energy efficiency. The implemented 22-nm 256-Kb SRAM can operate down to 0.45 V, with the minimum energy point at 0.5 V. At 0.5 V, TT corner, and <inline-formula> <tex-math>$25~{^{\\circ }}$ </tex-math></inline-formula>C, the measured maximum frequency (<inline-formula> <tex-math>$f_{\\max }$ </tex-math></inline-formula>) is 125 MHz with a 10 aJ/bit active energy, representing a 6.25 higher frequency with a 91% energy reduction, compared to the state-of-the-art 0.5-V SRAM in 28-nm bulk CMOS. The SRAM has a 12 pW/bit deep-sleep power and a 10 pW/bit SD power at 0.5 V.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 8","pages":"3043-3052"},"PeriodicalIF":5.6000,"publicationDate":"2025-01-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10820858/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Conventional low-voltage (LV) static random access memories (SRAMs) utilizing separate read-and-write assist circuits sacrifice access speed too much, leading to poor energy efficiency. Overlaying additional assist circuits to enable power-saving modes can exacerbate speed loss and energy inefficiency. This work proposes a coordinated read-write-hold-retention-shutdown (SD) assist circuit design for SRAMs to improve speed at low VDD and reduce leakage current in active and power-saving modes. This leads to overall power reduction and enhanced energy efficiency. The implemented 22-nm 256-Kb SRAM can operate down to 0.45 V, with the minimum energy point at 0.5 V. At 0.5 V, TT corner, and $25~{^{\circ }}$ C, the measured maximum frequency ($f_{\max }$ ) is 125 MHz with a 10 aJ/bit active energy, representing a 6.25 higher frequency with a 91% energy reduction, compared to the state-of-the-art 0.5-V SRAM in 28-nm bulk CMOS. The SRAM has a 12 pW/bit deep-sleep power and a 10 pW/bit SD power at 0.5 V.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.