A Multi-Event, 7.9-ps Resolution Time Amplification-Based TDC With an Ultra-Low Static Phase Error DLL Using Interpolator Recycling Technique for dToF Applications
{"title":"A Multi-Event, 7.9-ps Resolution Time Amplification-Based TDC With an Ultra-Low Static Phase Error DLL Using Interpolator Recycling Technique for dToF Applications","authors":"Xiayu Wang;Zhaoyang Zhou;Chunlin Li;Jin Hu;Dong Li;Yang Liu;Rui Ma;Zhangming Zhu","doi":"10.1109/JSSC.2024.3525085","DOIUrl":null,"url":null,"abstract":"In this article, a multi-event time-to-digital converter (TDC) with a high conversion rate using an interpolator recycling technique is proposed. The conversion dead time is greatly reduced by reusing the coarse interpolation channel (CIC) during the quantization of Start and Stop signals. A high resolution is achieved by a coarse-fine interpolation with a calibration-free high-linearity time amplifier (TA). A flash sub-TDC using a novel fully symmetric quantization (FSQ) scheme is proposed to implement fine interpolation, which helps improve the linearity. An ultra-low static phase error (SPE) DLL with time amplification in the feedback loop is proposed, to improve the TDC’s precision and linearity. The proposed TDC is fabricated in a 0.18-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>m CMOS technology, achieving a 7.9-ps resolution over a 2033.5-ns dynamic range with a conversion rate of 80 MS/s. The worst case DNL and INL are +0.15/−0.09 LSB and +0.69/−0.43 LSB, respectively.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 8","pages":"2946-2958"},"PeriodicalIF":5.6000,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10834553/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, a multi-event time-to-digital converter (TDC) with a high conversion rate using an interpolator recycling technique is proposed. The conversion dead time is greatly reduced by reusing the coarse interpolation channel (CIC) during the quantization of Start and Stop signals. A high resolution is achieved by a coarse-fine interpolation with a calibration-free high-linearity time amplifier (TA). A flash sub-TDC using a novel fully symmetric quantization (FSQ) scheme is proposed to implement fine interpolation, which helps improve the linearity. An ultra-low static phase error (SPE) DLL with time amplification in the feedback loop is proposed, to improve the TDC’s precision and linearity. The proposed TDC is fabricated in a 0.18-$\mu $ m CMOS technology, achieving a 7.9-ps resolution over a 2033.5-ns dynamic range with a conversion rate of 80 MS/s. The worst case DNL and INL are +0.15/−0.09 LSB and +0.69/−0.43 LSB, respectively.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.