{"title":"Self-Explanatory Fault Diagnosis Framework for Industrial Processes Using Graph Attention","authors":"Chae Sun Kim;Han Bit Kim;Jong Min Lee","doi":"10.1109/TII.2025.3526708","DOIUrl":null,"url":null,"abstract":"Explanations of deep learning fault diagnosis models have been crucial for risk management and subsequent maintenance actions. Furthermore, purely data-driven approaches for fault diagnosis in industrial processes, without integrating process knowledge or guidance, are limited in generalization ability. This article proposes a graph-based self-explanatory fault diagnosis model. The model employs a graph attention mechanism on a constructed graph data representation of the industrial process, facilitating to capture the causal relationships between process variables. Once the model is fully trained, variations in attention coefficients from normal operating condition are used to identify the root cause of the faulty scenario. This self-explanatory methodology elucidates the model's actual reasoning, obviating the need for additional separate explainable AI methods. Validations through benchmark processes demonstrate significant improvement in fault classification accuracy. Furthermore, variations in attention coefficients effectively identified precise origins of various fault types, including faults that had not been encountered during model training phase.","PeriodicalId":13301,"journal":{"name":"IEEE Transactions on Industrial Informatics","volume":"21 4","pages":"3396-3405"},"PeriodicalIF":9.9000,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Industrial Informatics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10845015/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Explanations of deep learning fault diagnosis models have been crucial for risk management and subsequent maintenance actions. Furthermore, purely data-driven approaches for fault diagnosis in industrial processes, without integrating process knowledge or guidance, are limited in generalization ability. This article proposes a graph-based self-explanatory fault diagnosis model. The model employs a graph attention mechanism on a constructed graph data representation of the industrial process, facilitating to capture the causal relationships between process variables. Once the model is fully trained, variations in attention coefficients from normal operating condition are used to identify the root cause of the faulty scenario. This self-explanatory methodology elucidates the model's actual reasoning, obviating the need for additional separate explainable AI methods. Validations through benchmark processes demonstrate significant improvement in fault classification accuracy. Furthermore, variations in attention coefficients effectively identified precise origins of various fault types, including faults that had not been encountered during model training phase.
期刊介绍:
The IEEE Transactions on Industrial Informatics is a multidisciplinary journal dedicated to publishing technical papers that connect theory with practical applications of informatics in industrial settings. It focuses on the utilization of information in intelligent, distributed, and agile industrial automation and control systems. The scope includes topics such as knowledge-based and AI-enhanced automation, intelligent computer control systems, flexible and collaborative manufacturing, industrial informatics in software-defined vehicles and robotics, computer vision, industrial cyber-physical and industrial IoT systems, real-time and networked embedded systems, security in industrial processes, industrial communications, systems interoperability, and human-machine interaction.