{"title":"Assessment of Test Voltage Levels for Accurate Type II Insulation Lifetime Evaluation Under Different Pressure Conditions","authors":"Yatai Ji;Paolo Giangrande;Weiduo Zhao;Jing Zhang;Pinjia Zhang","doi":"10.1109/TAES.2025.3531842","DOIUrl":null,"url":null,"abstract":"The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This article accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.","PeriodicalId":13157,"journal":{"name":"IEEE Transactions on Aerospace and Electronic Systems","volume":"61 3","pages":"6941-6950"},"PeriodicalIF":5.7000,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Aerospace and Electronic Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10848162/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, AEROSPACE","Score":null,"Total":0}
引用次数: 0
Abstract
The rapid increase in electric stress intensifies the risk of partial discharge (PD) and electrical aging in insulation. In aircraft applications where safety is critical, accurate lifetime estimation of the electrical machines (EMs) is paramount to ensure reliability. The electrical aging process of Type II insulated EMs induced by PD activity is significantly influenced by ambient pressure. Improper selection of test voltage during accelerated aging tests can lead to misleading estimations of lifetime. This article accurately determines the permissible voltage levels based on accelerated electrical aging tests and measurement of partial discharge inception voltage at six pressure levels. These findings provide valuable guidelines for insulation design and enable precise reliability assessment of EM for aircraft applications.
期刊介绍：
IEEE Transactions on Aerospace and Electronic Systems focuses on the organization, design, development, integration, and operation of complex systems for space, air, ocean, or ground environment. These systems include, but are not limited to, navigation, avionics, spacecraft, aerospace power, radar, sonar, telemetry, defense, transportation, automated testing, and command and control.
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