{"title":"Time-Series Multi-Instance Learning for Weakly Supervised Industrial Fault Detection","authors":"Chen Liu;Shibo He;Shizhong Li;Zhenyu Shi;Wenchao Meng","doi":"10.1109/TII.2024.3523591","DOIUrl":null,"url":null,"abstract":"Time-series anomaly detection plays a crucial role in industrial fault detection. Most existing studies follow either an unsupervised setting, which is prone to false alarms, or a supervised setting, which is time-consuming and labor-intensive. To address these limitations, we adopt an innovative weakly supervised paradigm for industrial fault detection, where segment-level labels are provided during training, while point-level predictions are made during inference. Within this paradigm, we propose an innovative <inline-formula><tex-math>$C$</tex-math></inline-formula>-ary tree-based multi-instance learning (MIL) framework. First, the entire time series is represented as a <inline-formula><tex-math>$C$</tex-math></inline-formula>-ary tree, where nodes representing subsequences of different lengths are treated as instances in the MIL framework. This design allows for the detection of both point and collective anomalies. Second, to detect out-of-distribution (OOD) anomalies that are not visible during training, we develop a vector quantization module to memorize regular historical patterns. OOD anomalies are then detected when they show significant discrepancies from all memorized patterns. Finally, we enhance the MIL framework with an attention-based pooling mechanism that allocates greater focus on anomalous instances, further improving detection performance. To validate the effectiveness of our method, we conduct experiments on four real-world industrial time-series datasets. The results show that our method outperforms existing approaches by at least 6.01% in AUROC under weak supervision.","PeriodicalId":13301,"journal":{"name":"IEEE Transactions on Industrial Informatics","volume":"21 4","pages":"3326-3335"},"PeriodicalIF":9.9000,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Industrial Informatics","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10855005/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Time-series anomaly detection plays a crucial role in industrial fault detection. Most existing studies follow either an unsupervised setting, which is prone to false alarms, or a supervised setting, which is time-consuming and labor-intensive. To address these limitations, we adopt an innovative weakly supervised paradigm for industrial fault detection, where segment-level labels are provided during training, while point-level predictions are made during inference. Within this paradigm, we propose an innovative $C$-ary tree-based multi-instance learning (MIL) framework. First, the entire time series is represented as a $C$-ary tree, where nodes representing subsequences of different lengths are treated as instances in the MIL framework. This design allows for the detection of both point and collective anomalies. Second, to detect out-of-distribution (OOD) anomalies that are not visible during training, we develop a vector quantization module to memorize regular historical patterns. OOD anomalies are then detected when they show significant discrepancies from all memorized patterns. Finally, we enhance the MIL framework with an attention-based pooling mechanism that allocates greater focus on anomalous instances, further improving detection performance. To validate the effectiveness of our method, we conduct experiments on four real-world industrial time-series datasets. The results show that our method outperforms existing approaches by at least 6.01% in AUROC under weak supervision.
期刊介绍:
The IEEE Transactions on Industrial Informatics is a multidisciplinary journal dedicated to publishing technical papers that connect theory with practical applications of informatics in industrial settings. It focuses on the utilization of information in intelligent, distributed, and agile industrial automation and control systems. The scope includes topics such as knowledge-based and AI-enhanced automation, intelligent computer control systems, flexible and collaborative manufacturing, industrial informatics in software-defined vehicles and robotics, computer vision, industrial cyber-physical and industrial IoT systems, real-time and networked embedded systems, security in industrial processes, industrial communications, systems interoperability, and human-machine interaction.