Sensitivity fields and parameter estimation from dielectric objects.

Abstract

The quantitative phase image formation process is posed as a problem of parameter estimation from intensity measurements. This approach is inclusive of traditional pixel-oriented imaging, where the sought parameters are the pixel values. The resulting optimization process to find the parameters is then seen to depend on the sensitivity field: this is the gradient of the scattered field with respect to the parameters, and it turns out to obey a scattering relationship that is analogous to that of the original scattered field. Examples are given from several regimes of scattering strength.