{"title":"Enhancing Reliability in Embedded Systems Hardware: A Literature Survey","authors":"Ryan Aalund;Vincent Philip Paglioni","doi":"10.1109/ACCESS.2025.3534138","DOIUrl":null,"url":null,"abstract":"Embedded Systems are used in extreme conditions, often for long lifespans; as such, ensuring hardware reliability is essential. Additionally, the applications of embedded systems can be safety-critical or costly in the event of a failure. Applications and environments such as these demand high reliability. This literature survey explores the challenges of achieving hardware reliability in embedded systems. It examines critical works using different methodologies and viewpoints to summarize hardware reliability comprehensively. The paper discusses the main failure modes identified in embedded systems hardware, evaluates various mitigation strategies, and identifies emerging trends influencing the future of embedded system design. By critically analyzing existing literature, this survey is a resource for future research efforts focused on growing the reliability of embedded systems. Finally, this paper outlines the motivation and first methods for a systems-level approach to embedded systems reliability.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"17285-17302"},"PeriodicalIF":3.4000,"publicationDate":"2025-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10852318","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10852318/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Embedded Systems are used in extreme conditions, often for long lifespans; as such, ensuring hardware reliability is essential. Additionally, the applications of embedded systems can be safety-critical or costly in the event of a failure. Applications and environments such as these demand high reliability. This literature survey explores the challenges of achieving hardware reliability in embedded systems. It examines critical works using different methodologies and viewpoints to summarize hardware reliability comprehensively. The paper discusses the main failure modes identified in embedded systems hardware, evaluates various mitigation strategies, and identifies emerging trends influencing the future of embedded system design. By critically analyzing existing literature, this survey is a resource for future research efforts focused on growing the reliability of embedded systems. Finally, this paper outlines the motivation and first methods for a systems-level approach to embedded systems reliability.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.