Enhancing Reliability in Embedded Systems Hardware: A Literature Survey

IF 3.6 3区 计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS IEEE Access Pub Date : 2025-01-24 DOI:10.1109/ACCESS.2025.3534138
Ryan Aalund;Vincent Philip Paglioni
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Abstract

Embedded Systems are used in extreme conditions, often for long lifespans; as such, ensuring hardware reliability is essential. Additionally, the applications of embedded systems can be safety-critical or costly in the event of a failure. Applications and environments such as these demand high reliability. This literature survey explores the challenges of achieving hardware reliability in embedded systems. It examines critical works using different methodologies and viewpoints to summarize hardware reliability comprehensively. The paper discusses the main failure modes identified in embedded systems hardware, evaluates various mitigation strategies, and identifies emerging trends influencing the future of embedded system design. By critically analyzing existing literature, this survey is a resource for future research efforts focused on growing the reliability of embedded systems. Finally, this paper outlines the motivation and first methods for a systems-level approach to embedded systems reliability.
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提高嵌入式系统硬件的可靠性:文献综述
嵌入式系统在极端条件下使用,通常使用寿命长;因此,确保硬件可靠性至关重要。此外,嵌入式系统的应用程序在发生故障时可能对安全至关重要或代价高昂。诸如此类的应用程序和环境需要高可靠性。本文献综述探讨了在嵌入式系统中实现硬件可靠性的挑战。它考察了使用不同的方法和观点的关键工作,以全面总结硬件可靠性。本文讨论了嵌入式系统硬件中确定的主要故障模式,评估了各种缓解策略,并确定了影响嵌入式系统设计未来的新兴趋势。通过批判性地分析现有文献,本调查为未来的研究工作提供了资源,重点是提高嵌入式系统的可靠性。最后,本文概述了采用系统级方法研究嵌入式系统可靠性的动机和初步方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
IEEE Access
IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍: IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.
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