Application of total-reflection X-ray fluorescence (TXRF) to study authigenic carbonates in planktonic foraminifera

IF 3.8 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2025-02-04 DOI:10.1016/j.sab.2025.107141
Artem S. Maltsev , Galina V. Pashkova , Alena N. Zhilicheva , Alexandra V. Romanova
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Abstract

In this study we present results showing the elemental composition of diagenetic coatings on foraminiferal tests by total-reflection X-ray fluorescence (TXRF) within N. pachyderma diagenetic shells from the Holocene sediments in the Okhotsk Sea. The method includes direct deposition of individual foraminifera of micro-size on the quartz carrier and digestion by 2 N nitric acid on it. The investigation of the specimen prepared shows its suitability for TXRF analysis based on its thickness and the distribution of particles within. The quantification of elements is based on the standardless method, but the elements with atomic number Z < 13 were not determined since the measurement is made in air. Since the total composition of the sample was not calculated, the element concentrations were accepted only as relative. Precision values did not exceed 10 % for all elements. 14 types of foraminifera shells (129 samples in total) were analyzed by the TXRF method and the following elements were determined: Cl, K, Ca, Mn, Fe, Zn, Sr. Application of principal component analysis showed the difference among samples with a respect to diagenetic alternation degree. The results of diagenetic studies were confirmed by literature data.

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应用全反射x射线荧光(TXRF)研究浮游有孔虫中自生碳酸盐
本文报道了利用全反射x射线荧光(TXRF)对鄂霍次克海全新世沉积物中厚皮乳孢菌(N. pachyderma)成岩壳进行的有孔虫测试中成岩涂层元素组成的结果。该方法包括将单个微型有孔虫直接沉积在石英载体上,并在其上用2n硝酸消化。对所制备的试样的研究表明,根据其厚度和颗粒分布,它适合TXRF分析。元素的定量采用无标法,但原子序数为Z <;由于测量是在空气中进行的,因此无法确定其中的13个。由于没有计算样品的总组成,所以元素浓度只被认为是相对的。所有元素的精度值不超过10%。采用TXRF法对14种有孔虫壳(共129个样品)进行了分析,测定了Cl、K、Ca、Mn、Fe、Zn、sr等元素。应用主成分分析法分析了样品间成岩交替程度的差异。文献资料证实了成岩研究的结果。
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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