An Offset Compensated Charge Transfer Pre-Sensing Bitline Sense Amplifier

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2025-02-10 DOI:10.1109/JSSC.2025.3531904
Kyeongtae Nam;Dongil Lee;Kyuchang Kang;Sang-Yun Kim;Changyoung Lee;Hyunchul Yoon;Donggeon Kim;Bokyeon Won;Jae-Joon Song;Jaehyuk Kim;Incheol Nam;Young-Hun Seo;Jeong-Don Ihm;Changsik Yoo;Sangjoon Hwang
{"title":"An Offset Compensated Charge Transfer Pre-Sensing Bitline Sense Amplifier","authors":"Kyeongtae Nam;Dongil Lee;Kyuchang Kang;Sang-Yun Kim;Changyoung Lee;Hyunchul Yoon;Donggeon Kim;Bokyeon Won;Jae-Joon Song;Jaehyuk Kim;Incheol Nam;Young-Hun Seo;Jeong-Don Ihm;Changsik Yoo;Sangjoon Hwang","doi":"10.1109/JSSC.2025.3531904","DOIUrl":null,"url":null,"abstract":"A bitline sense amplifier (BLSA) with offset compensated charge transfer pre-sensing (OC-CTPS) scheme is implemented using 14-nm dynamic random access memory (DRAM) process. The offset compensation (OC) is operated by diode connection without additional size overhead for BLSA. The average fail bit count (FBC) attributed to a mismatch of charge transfer (CT) transistor was reduced by 94% after performing OC. Furthermore, the proposed OC-CTPS BLSA accomplished 250 and 500 ps of CT time (<inline-formula> <tex-math>$t_{\\mathrm {CT}}$ </tex-math></inline-formula>) window, representing the <inline-formula> <tex-math>$t_{\\mathrm {CT}}$ </tex-math></inline-formula> region where the FBC is lower than the standard FBC, at the temperatures of <inline-formula> <tex-math>$- 25~^{\\circ }$ </tex-math></inline-formula>C and <inline-formula> <tex-math>$100~^{\\circ }$ </tex-math></inline-formula>C, respectively, without modifying any operations for CT. Moreover, our approach ensures robust and stable sensing even at operating voltages as low as 0.75 V, compared to conventional latch-based OC BLSA.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"1359-1367"},"PeriodicalIF":5.6000,"publicationDate":"2025-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10878507/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

A bitline sense amplifier (BLSA) with offset compensated charge transfer pre-sensing (OC-CTPS) scheme is implemented using 14-nm dynamic random access memory (DRAM) process. The offset compensation (OC) is operated by diode connection without additional size overhead for BLSA. The average fail bit count (FBC) attributed to a mismatch of charge transfer (CT) transistor was reduced by 94% after performing OC. Furthermore, the proposed OC-CTPS BLSA accomplished 250 and 500 ps of CT time ( $t_{\mathrm {CT}}$ ) window, representing the $t_{\mathrm {CT}}$ region where the FBC is lower than the standard FBC, at the temperatures of $- 25~^{\circ }$ C and $100~^{\circ }$ C, respectively, without modifying any operations for CT. Moreover, our approach ensures robust and stable sensing even at operating voltages as low as 0.75 V, compared to conventional latch-based OC BLSA.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
偏移补偿电荷转移预感测位线感测放大器
采用14nm动态随机存取存储器(DRAM)工艺实现了一种具有偏移补偿电荷转移预感(OC-CTPS)方案的位线感测放大器(BLSA)。偏移补偿(OC)是由二极管连接操作,没有额外的尺寸开销对于BLSA。在执行OC后,归因于电荷转移(CT)晶体管失配的平均失效位计数(FBC)减少了94%。此外,所提出的OC-CTPS BLSA在温度为$- 25~^{\circ}$ C和$100~^{\circ}$ C的情况下,分别实现了250和500 ps的CT时间($t_{\ mathm {CT}}$)窗口,表示FBC低于标准FBC的$t_{\ mathm {CT}}$区域。此外,与传统的基于锁存器的OC BLSA相比,我们的方法即使在低至0.75 V的工作电压下也能确保鲁棒和稳定的传感。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
期刊最新文献
IEEE Journal of Solid-State Circuits Information for Authors A 16 MHz RC Frequency Reference With ±450 ppm Inaccuracy From –45 ° C to 85 ° C After Accelerated Aging Guest Editorial Introduction to the Special Section on the 2025 Symposium on VLSI Circuits IEEE Journal of Solid-State Circuits Publication Information New Associate Editor
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1