{"title":"Enhancing memristor multilevel resistance state with linearity potentiation <i>via</i> the feedforward pulse scheme.","authors":"Zhuo Diao, Ryohei Yamamoto, Zijie Meng, Tetsuya Tohei, Akira Sakai","doi":"10.1039/d4nh00623b","DOIUrl":null,"url":null,"abstract":"<p><p>Mapping the weights of an Artificial Neural Network (ANN) onto the resistance values of analog memristors can significantly enhance the throughput and energy efficiency of artificial intelligence (AI) applications, while also supporting AI deployment on edge devices. However, unlike traditional digital-based processing units, implementing AI computation on analog memristors presents certain challenges. The non-linear resistance switching characteristics and limited numerical bit precision, determined by the number of program levels, can become bottlenecks affecting the accuracy of ANN models. In this study, we introduce a resistance control method, a feedforward pulse scheme that enhances resistance configuration precision and increases the number of programmable levels. Additionally, we propose an evaluation method to explore the impact of setting multi-level resistance states on ANN accuracy. Through demonstrations on a TiO<sub>2-<i>x</i></sub>-based memristor, our method achieves 512 states on a device with a high resistance state to a low resistance state ratio of just 1.19. Our approach achieves 95.5% accuracy on ResNet-34 with over 20 million parameters through weight transfer, thereby demonstrating the potential of analog memristors in AI model inference. Furthermore, our findings pave the way for future advancements in increasing resistance states, which will enable more complex AI tasks and enhance the in-memory computational capabilities required for AI edge applications.</p>","PeriodicalId":93,"journal":{"name":"Nanoscale Horizons","volume":" ","pages":""},"PeriodicalIF":8.0000,"publicationDate":"2025-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanoscale Horizons","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1039/d4nh00623b","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
Mapping the weights of an Artificial Neural Network (ANN) onto the resistance values of analog memristors can significantly enhance the throughput and energy efficiency of artificial intelligence (AI) applications, while also supporting AI deployment on edge devices. However, unlike traditional digital-based processing units, implementing AI computation on analog memristors presents certain challenges. The non-linear resistance switching characteristics and limited numerical bit precision, determined by the number of program levels, can become bottlenecks affecting the accuracy of ANN models. In this study, we introduce a resistance control method, a feedforward pulse scheme that enhances resistance configuration precision and increases the number of programmable levels. Additionally, we propose an evaluation method to explore the impact of setting multi-level resistance states on ANN accuracy. Through demonstrations on a TiO2-x-based memristor, our method achieves 512 states on a device with a high resistance state to a low resistance state ratio of just 1.19. Our approach achieves 95.5% accuracy on ResNet-34 with over 20 million parameters through weight transfer, thereby demonstrating the potential of analog memristors in AI model inference. Furthermore, our findings pave the way for future advancements in increasing resistance states, which will enable more complex AI tasks and enhance the in-memory computational capabilities required for AI edge applications.
期刊介绍:
Nanoscale Horizons stands out as a premier journal for publishing exceptionally high-quality and innovative nanoscience and nanotechnology. The emphasis lies on original research that introduces a new concept or a novel perspective (a conceptual advance), prioritizing this over reporting technological improvements. Nevertheless, outstanding articles showcasing truly groundbreaking developments, including record-breaking performance, may also find a place in the journal. Published work must be of substantial general interest to our broad and diverse readership across the nanoscience and nanotechnology community.