Features of the Ga2O3 Layers Synthesized on Silicon by Molecular Layering

IF 0.5 4区 材料科学 Q4 CRYSTALLOGRAPHY Crystallography Reports Pub Date : 2025-02-16 DOI:10.1134/S1063774524602107
A. V. Drozd, V. A. Dmitriev, I. E. Gabis, V. A. Moshnikov, A. P. Baraban
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Abstract

The possibility of synthesizing gallium oxide semiconductor layers by the classical thermal method of molecular layering with trimethyl gallium and ozone precursors and controlling the electrical properties of the synthesized layers is shown. Homogeneous layers of specified thickness have been deposited in a single cycle onto a silicon substrate, monocrystalline quartz, and high-aspect-ratio 3D substrates in the form of microchannel plates. The synthesized gallium oxide layers are amorphous, conforming to the Ga2O3 stoichiometry; have a band gap of 4.9 ± 0.2 eV; and do not exhibit the impurity conductivity. The possibility of obtaining gallium oxide films with the impurity conductivity by molecular layering according to a specified program, with alternation of the chemical composition of the precursors used, is demonstrated.

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分子分层法在硅表面合成Ga2O3层的特性
指出了用三甲基镓和臭氧前驱体分子分层的经典热方法合成氧化镓半导体层并控制所合成层的电学性质的可能性。指定厚度的均匀层已在单个循环中沉积在硅衬底,单晶石英和以微通道板形式的高纵横比3D衬底上。合成的氧化镓层是无定形的,符合Ga2O3的化学计量;带隙为4.9±0.2 eV;并且不表现出杂质的导电性。论证了通过改变前驱体的化学组成,按规定程序进行分子分层制备具有杂质导电性的氧化镓薄膜的可能性。
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来源期刊
Crystallography Reports
Crystallography Reports 化学-晶体学
CiteScore
1.10
自引率
28.60%
发文量
96
审稿时长
4-8 weeks
期刊介绍: Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
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