On the Technology of Production of Antique Red-Glazed Pottery (Bosporan, Pontic, and Eastern Sigillata)

IF 0.6 4区 材料科学 Q4 CRYSTALLOGRAPHY Crystallography Reports Pub Date : 2025-02-16 DOI:10.1134/S1063774524602466
A. V. Mandrykina, D. V. Zhuravlev, P. V. Guryeva, E. S. Kovalenko, O. A. Kondratyev, D. N. Khmelenin, E. Yu. Tereschenko, E. B. Yatsishina
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Abstract

Based on comprehensive studies of fragments of antique red-glazed pottery (terra sigillata) of the Pontic, Bosporan, and Eastern groups, characteristic technological features of the slip layer and ceramic bulk have been identified. The Eastern-sigillata samples exhibited the best quality. The small size of the pores and inclusions suggests the use of finely dispersed clay. In addition, a mixture of two types of clay (ferrous and more refractory calcareous) was revealed. The special and, apparently, careful preparation of the clay suspension for the slip layer production included addition of a potassium-containing preparation, presumably, potassium potash (to glaze better the layer), as well as an iron-containing pigment, likely, ochre. The firing temperature for this group of samples was about 1000°C. Pontic sigillata products differed from the Eastern pottery by a lower content of potassium potash and the absence of specially added pigment in the varnish layer. The firing temperature was lower: 850–900°C. The Bosporan products are characterized by much less thorough preparation of both the clay raw material as a base and the varnish layer, as well as the lowest firing temperature in comparison with other groups (500–900°C).

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来源期刊
Crystallography Reports
Crystallography Reports 化学-晶体学
CiteScore
1.10
自引率
28.60%
发文量
96
审稿时长
4-8 weeks
期刊介绍: Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
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