Triple-Node-Upset Recovery High-Impedance-State-Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications

Abstract

This article proposes a 4 × 4-device-Matrix-based Cost-optimized Triple-node-upset (TNU)-recovery High-impedance-state (HIS)-insensitive and Single-event-transient (SET) filtering Latch, namely MCTHSL, designed for aerospace applications. The MCTHSL comprises a 4 × 4 device matrix to completely provide TNU recovery, and thus, it is HIS insensitive. The input of a Schmitt trigger (ST) is split to create an input-split Schmitt trigger, namely ISST, to simultaneously provide the functions of a C-element (CE), an SET filtering device, and a delay element. The matrix comprises 15 mutually interlocking two-input CEs and an ISST to store values, recover from TNUs, and filter SETs with HIS insensitivity and cost optimization. Simulation results demonstrate the aforementioned features and moderate sensitivity to the impacts of process, voltage, and temperature variations of our proposed MCTHSL in comparison with the existing latches with TNU recovery. The features are achieved at the cost of moderate overhead in terms of area, delay, and power.