Triple-Node-Upset Recovery High-Impedance-State Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications

{"title":"Triple-Node-Upset Recovery High-Impedance-State Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications","authors":"Aibin Yan, Zhuoyuan Lin, Yongkang Xu, Na Bai, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen","doi":"10.1109/taes.2025.3546581","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13157,"journal":{"name":"IEEE Transactions on Aerospace and Electronic Systems","volume":"28 1","pages":""},"PeriodicalIF":5.1000,"publicationDate":"2025-02-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Aerospace and Electronic Systems","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/taes.2025.3546581","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, AEROSPACE","Score":null,"Total":0}