{"title":"An Explainable Deep Learning Network With Transformer and Custom CNN for Bean Leaf Disease Classification","authors":"R. Karthik;R. Aswin;K. S. Geetha;K. Suganthi","doi":"10.1109/ACCESS.2025.3546017","DOIUrl":null,"url":null,"abstract":"Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Transformer (PVT) and Group Context Aware Depthwise Shuffle Network (GCADSN). The PVT effectively models long-range dependencies, identifying disease patterns across larger leaf areas, while the GCADSN focuses on capturing nuanced, context-specific features. This combined approach leads to a richer representation of the input image, resulting in improved disease classification. Model explainability is provided through GradCAM visualizations, highlighting the image regions crucial for the model’s predictions and enabling transparent, class-specific insights. The model’s performance was rigorously tested using the IBean dataset, a collection of images depicting various bean leaf diseases, including common rust, angular leaf spot, and healthy leaves. Our proposed network achieved a high accuracy of 97.66%, outperforming many current state-of-the-art deep learning models. Furthermore, it demonstrated strong performance across other key metrics, with an F1 score of 97.67%, precision of 97.83%, and recall of 97.67%. Importantly, the model’s computational efficiency makes it well-suited for practical application in real-world agricultural scenarios.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"38562-38573"},"PeriodicalIF":3.4000,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10904208","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10904208/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Bean rust and angular leaf spot pose significant challenges to bean cultivation, impacting yields. Prompt disease identification maximizes productivity, but traditional methods need specialized expertise. This research presents an explainable deep learning model that combines the Pyramid Vision Transformer (PVT) and Group Context Aware Depthwise Shuffle Network (GCADSN). The PVT effectively models long-range dependencies, identifying disease patterns across larger leaf areas, while the GCADSN focuses on capturing nuanced, context-specific features. This combined approach leads to a richer representation of the input image, resulting in improved disease classification. Model explainability is provided through GradCAM visualizations, highlighting the image regions crucial for the model’s predictions and enabling transparent, class-specific insights. The model’s performance was rigorously tested using the IBean dataset, a collection of images depicting various bean leaf diseases, including common rust, angular leaf spot, and healthy leaves. Our proposed network achieved a high accuracy of 97.66%, outperforming many current state-of-the-art deep learning models. Furthermore, it demonstrated strong performance across other key metrics, with an F1 score of 97.67%, precision of 97.83%, and recall of 97.67%. Importantly, the model’s computational efficiency makes it well-suited for practical application in real-world agricultural scenarios.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.