A Dual-Mode Coupling MMW Antenna With Dual Polarizations and Wide Scanning Angles

IF 4.8 2区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Antennas and Wireless Propagation Letters Pub Date : 2024-11-26 DOI:10.1109/LAWP.2024.3507041
Long Pan;Rui Wang;Yong Luo
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Abstract

Millimete-wave (MMW) communication and sensing systems suffer from the challenge of realizing dual-polarized phased array antenna with large beam-scanning angles, due to the array unit can hardly having the radiation pattern with wide 3 dB beamwidth in both orthogonal planes (one is the beam-scanning plane). In this letter, we propose a dual-mode coupling radiation mechanism to integrate a monopole mode and a patch mode for obtaining 3 dB beamwidth larger than 120° in both two orthogonal planes. Hence, the array cascaded from the antenna unit can realize a wide beam scanning of −60°∼+60° within gain degradation of less than 3 dB in both ±45° polarizations. Based on this principle, a ±45° dual-polarized antenna unit is designed, and a prototype of a 1 × 8 ±45° dual-polarized phased array is fabricated. Experiments demonstrate that the MMW array operating in 25.5 GHz to 28 GHz (active |S11|< −10 dB) can scan from −60° to +60° with gain fluctuations less than 3 dB. The proposed MMW antenna can be applied to B5G/6G MMW communications and sensing.
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一种双极化宽扫描角双模耦合毫米波天线
在毫米波通信和传感系统中,由于阵列单元难以在两个正交平面(一个是波束扫描平面)上都具有宽3db波束宽度的辐射方向图,因此难以实现大波束扫描角的双极化相控阵天线。在这封信中,我们提出了一种双模耦合辐射机制,将单极子模式和贴片模式集成在一起,在两个正交平面上获得大于120°的3db波束宽度。因此,从天线单元级联的阵列可以在±45°极化下实现−60°~ +60°的宽波束扫描,且增益衰减小于3 dB。基于该原理,设计了±45°双极化天线单元,并制作了1 × 8±45°双极化相控阵样机。实验表明,工作在25.5 GHz ~ 28 GHz(有源|S11|<−10 dB)的毫米波阵列可以在−60°~ +60°范围内扫描,增益波动小于3 dB。所提出的毫米波天线可应用于B5G/6G毫米波通信和传感。
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来源期刊
CiteScore
8.00
自引率
9.50%
发文量
529
审稿时长
1.0 months
期刊介绍: IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.
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