Synchrotron X-ray diffraction of phase evolution in Fe–Cr–Al/Zr system during pulsed electron-beam processing

Abstract

For the first time, the synchrotron X‑ray diffraction is used to study the phase evolution in the Fe-Cr-Al(film)/Zr(substrate) system during its low-energy high-current electron beam (LEHCEB) processing. It is found that surface layer undergoes successive phase transformations with increasing number of pulses and the energy density of LEHCEB. Initially, only Fe-Cr-Al film melting occurs. Next, the gradual film dissolution and the amorphous Fe-Cr-Al-Zr phase formation takes place, followed by the nucleation and growth of FeZr₂ intermetallic compound. And finally, the formation the β‑Zr solid solution phase occurs. During the interruption of the LEHCEB process at different stages, it is possible to achieve desired phase composition and surface layer properties.