{"title":"Component Level EM Emission Assessment and Management for RF Desensitization","authors":"Xiangrui Su;Wenchang Huang;Junghee Cho;Joonki Paek;Chulsoon Hwang","doi":"10.1109/TEMC.2025.3539591","DOIUrl":null,"url":null,"abstract":"Radio frequency (RF) desensitization is a common issue caused by high-speed components in modern electronic devices. Consequently, numerous studies have focused on characterizing and quantifying electromagnetic (EM) emission sources by using near field scanning to detect EM noise sources. However, before near field scanning, no predetermined threshold is available to quickly assess whether an EM noise source will pose RF desensitization risks in the receiving antenna. This article presents a method to optimize near field scanning settings through EM emission management analysis. Drawing on experience from numerous EM emission studies, we introduce an EM emission management procedure for two common noise sources: dipole-like noise sources and cavity noise sources. The scanning results of three practical examples are provided to validate the efficiency of the proposed EM emission management analysis.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"67 2","pages":"578-586"},"PeriodicalIF":2.5000,"publicationDate":"2025-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10918901/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Radio frequency (RF) desensitization is a common issue caused by high-speed components in modern electronic devices. Consequently, numerous studies have focused on characterizing and quantifying electromagnetic (EM) emission sources by using near field scanning to detect EM noise sources. However, before near field scanning, no predetermined threshold is available to quickly assess whether an EM noise source will pose RF desensitization risks in the receiving antenna. This article presents a method to optimize near field scanning settings through EM emission management analysis. Drawing on experience from numerous EM emission studies, we introduce an EM emission management procedure for two common noise sources: dipole-like noise sources and cavity noise sources. The scanning results of three practical examples are provided to validate the efficiency of the proposed EM emission management analysis.
期刊介绍：
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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