FLaNS: Feature-Label Negative Sampling for Out-of-Distribution Detection

IF 3.6 3区 计算机科学 Q2 COMPUTER SCIENCE, INFORMATION SYSTEMS IEEE Access Pub Date : 2025-03-06 DOI:10.1109/ACCESS.2025.3548702
Chaejin Lim;Junhee Hyeon;Kiseong Lee;Dongil Han
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Abstract

Many existing deep learning models suffer from a fundamental limitation, where they often misclassify Out-of-Distribution (OOD) data as In-Distribution (ID) data. OOD data represent data patterns that differ from the training distribution, such as images of unseen classes or different domains. This misclassification occurs because deep learning models are inherently designed to classify inputs into one of their known categories. To address this limitation, we propose Feature-Label Negative Sampling (FLaNS), which exploits the observation that OOD data inherently exhibit mismatches between features and their assigned labels. Our method constructs negative data by deliberately creating feature-label mismatches from ID data, which naturally deviate from the learned ID distribution. These synthetic data enable the Support Vector Machine (SVM) to learn decision boundaries that discriminate between ID and OOD data without requiring actual OOD data during training. We evaluated our method on the NCT-CRC-HE and CIFAR-100 datasets using two backbone models. Our approach demonstrates stable and reliable performance in both Receiver Operating Characteristics (ROC) Curve Area (AUROC) and False Positive Rate at 95% True Positive Rate (FPR95) metrics compared to existing methods. This research enhances OOD detection by introducing a method that leverages feature-label mismatches in ID data, improving detection performance without needing diverse OOD data, which are often difficult to collect.
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FLaNS:用于非分布检测的特征标签负采样
许多现有的深度学习模型都存在一个基本的局限性,即它们经常将分布外(OOD)数据错误地分类为分布内(ID)数据。OOD数据表示与训练分布不同的数据模式,例如未见过的类或不同域的图像。之所以会出现这种错误分类,是因为深度学习模型天生就会将输入分类到已知的类别中。为了解决这一限制,我们提出了特征标签负抽样(FLaNS),它利用OOD数据固有地表现出特征与其分配标签之间的不匹配。我们的方法通过故意从ID数据中创建特征标签不匹配来构建负数据,这自然会偏离学习到的ID分布。这些合成数据使支持向量机(SVM)能够学习区分ID和OOD数据的决策边界,而无需在训练期间使用实际的OOD数据。我们使用两个骨干模型在NCT-CRC-HE和CIFAR-100数据集上评估了我们的方法。与现有方法相比,我们的方法在受试者工作特征(ROC)曲线面积(AUROC)和假阳性率(95%真阳性率(FPR95)指标上都表现出稳定可靠的性能。本研究通过引入一种利用ID数据中特征标签不匹配的方法来增强OOD检测,从而提高检测性能,而不需要不同的OOD数据,这些数据通常难以收集。
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来源期刊
IEEE Access
IEEE Access COMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍: IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest. IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on: Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals. Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering. Development of new or improved fabrication or manufacturing techniques. Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.
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