Mona Esmaeili;Sameer D. Hemmady;Oameed Noakoasteen;Edl Schamiloglu;Christos Christodoulou;Payman Zarkesh-Ha
{"title":"Advancing EMC Analysis With GAN-Driven Signal Classification and Waveform Modulation","authors":"Mona Esmaeili;Sameer D. Hemmady;Oameed Noakoasteen;Edl Schamiloglu;Christos Christodoulou;Payman Zarkesh-Ha","doi":"10.1109/ACCESS.2025.3548033","DOIUrl":null,"url":null,"abstract":"This study advances Electromagnetic Compatibility (EMC) by investigating how electromagnetic interference (EMI) from Radio Frequency (RF) sources affects digital interconnects. Unlike traditional analyses centered on Continuous Wave (CW) signals, we adopt an RF-focused approach using S-parameter data and consistent RF power to emphasize steady-state responses. This method eliminates the need for time-domain conversions, allowing for more accurate analysis. Our research introduces a novel image-based classification system that accurately assesses signal safety based on steady-state responses. By leveraging a Generative Adversarial Network (GAN) trained on ‘safe’ and ‘unsafe’ signal images, our system can effectively recognize and distinguish between these two states. The GAN’s ability to generate realistic signal patterns enhances classification accuracy, especially when empirical data is limited. This approach has been validated through multiple transformations to ensure robustness and reliability. The findings offer significant improvements in EMC analysis and provide practical guidelines for designing robust digital interconnects. These advancements contribute to enhancing the reliability and security of electronic devices in environments with high RF interference, making them better suited for real-world commercial applications where signal integrity is critical.","PeriodicalId":13079,"journal":{"name":"IEEE Access","volume":"13 ","pages":"44789-44799"},"PeriodicalIF":3.4000,"publicationDate":"2025-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10910108","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Access","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10910108/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
This study advances Electromagnetic Compatibility (EMC) by investigating how electromagnetic interference (EMI) from Radio Frequency (RF) sources affects digital interconnects. Unlike traditional analyses centered on Continuous Wave (CW) signals, we adopt an RF-focused approach using S-parameter data and consistent RF power to emphasize steady-state responses. This method eliminates the need for time-domain conversions, allowing for more accurate analysis. Our research introduces a novel image-based classification system that accurately assesses signal safety based on steady-state responses. By leveraging a Generative Adversarial Network (GAN) trained on ‘safe’ and ‘unsafe’ signal images, our system can effectively recognize and distinguish between these two states. The GAN’s ability to generate realistic signal patterns enhances classification accuracy, especially when empirical data is limited. This approach has been validated through multiple transformations to ensure robustness and reliability. The findings offer significant improvements in EMC analysis and provide practical guidelines for designing robust digital interconnects. These advancements contribute to enhancing the reliability and security of electronic devices in environments with high RF interference, making them better suited for real-world commercial applications where signal integrity is critical.
IEEE AccessCOMPUTER SCIENCE, INFORMATION SYSTEMSENGIN-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
9.80
自引率
7.70%
发文量
6673
审稿时长
6 weeks
期刊介绍:
IEEE Access® is a multidisciplinary, open access (OA), applications-oriented, all-electronic archival journal that continuously presents the results of original research or development across all of IEEE''s fields of interest.
IEEE Access will publish articles that are of high interest to readers, original, technically correct, and clearly presented. Supported by author publication charges (APC), its hallmarks are a rapid peer review and publication process with open access to all readers. Unlike IEEE''s traditional Transactions or Journals, reviews are "binary", in that reviewers will either Accept or Reject an article in the form it is submitted in order to achieve rapid turnaround. Especially encouraged are submissions on:
Multidisciplinary topics, or applications-oriented articles and negative results that do not fit within the scope of IEEE''s traditional journals.
Practical articles discussing new experiments or measurement techniques, interesting solutions to engineering.
Development of new or improved fabrication or manufacturing techniques.
Reviews or survey articles of new or evolving fields oriented to assist others in understanding the new area.