Microwave characterization of plasmonic antennas through electron energy loss spectroscopy†

IF 4.6 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Nanoscale Advances Pub Date : 2025-03-19 DOI:10.1039/D4NA00960F
Igor Getmanov, Qingxiao Wang, Heng Wang, Atif Shamim and Dalaver H. Anjum
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Abstract

The absence of suitable equipment has long hindered traditional microwave characterization of nano-antennas and their effective design at frequencies beyond several terahertz, limiting the exploration of the myriad applications of plasmonic antennas by the microwave engineering community and necessitating a paradigm shift in characterization methods. This work addresses this challenge by introducing a novel approach employing electron energy loss spectroscopy (EELS) to characterize input impedance and scattering parameters of plasmonic antennas from mid-infrared to optical frequencies. Central to this method is a newly developed theoretical framework that links electron energy loss probability with microwave scattering parameters, crucial for antenna design. We validated this approach through a study of a single plasmonic dipole, finding a good correspondence between the measured EEL spectra and our theoretical model, supported by our developed simulation model. Drawing upon this correlation, we proposed an algorithm for the reverse procedure of extracting S-parameters and input impedance from experimental EEL probability. Spatial profiles of input impedance and S-parameters for a single plasmonic dipole were experimentally characterized across the broad frequency spectrum ranging from 25 to 150 THz and compared with simulation results, revealing a robust correlation, particularly at resonant frequencies. Our non-contact method could serve as an alternative approach to microwave parameters characterization, functioning similarly to a vector network analyzer (VNA) but extending its capabilities to much higher frequencies, where VNAs are not available.

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等离子体天线的微波特性的电子能量损失谱。
长期以来,合适设备的缺乏阻碍了纳米天线的传统微波表征及其在超过几太赫兹频率下的有效设计,限制了微波工程界对等离子体天线无数应用的探索,并需要表征方法的范式转变。这项工作通过引入一种利用电子能量损失谱(EELS)来表征中红外到光学频率等离子体天线的输入阻抗和散射参数的新方法来解决这一挑战。该方法的核心是一个新开发的理论框架,将电子能量损失概率与微波散射参数联系起来,这对天线设计至关重要。我们通过对单个等离子体偶极子的研究验证了这一方法,发现测量的EEL光谱与我们的理论模型之间有很好的对应关系,并得到了我们开发的模拟模型的支持。利用这种相关性,我们提出了一种从实验EEL概率中提取s参数和输入阻抗的反向过程算法。在25至150太赫兹的宽频谱范围内,对单个等离子体偶极子的输入阻抗和s参数的空间分布进行了实验表征,并与模拟结果进行了比较,揭示了一个强大的相关性,特别是在谐振频率。我们的非接触式方法可以作为微波参数表征的替代方法,功能类似于矢量网络分析仪(VNA),但将其功能扩展到更高的频率,而VNA是不可用的。
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来源期刊
Nanoscale Advances
Nanoscale Advances Multiple-
CiteScore
8.00
自引率
2.10%
发文量
461
审稿时长
9 weeks
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