{"title":"A Duty-Cycle Switching 30-Gb/s Burst-Mode CDR With 1.6-ns Locking Time in 28-nm CMOS","authors":"Xin Wang;Achim Vandierendonck;Bruno Govaerts;Tinus Pannier;Warre Geeroms;Caro Meysmans;Johan Bauwelinck;Guy Torfs","doi":"10.1109/JSSC.2025.3556524","DOIUrl":null,"url":null,"abstract":"This article presents a closed-loop type burst-mode clock and data recovery (BM-CDR) circuit with fast phase offset detection using 8/3x-fractional oversampling in the periodic preamble. The proposed phase offset detector achieves a resolution of 1/8 unit intervals (UIs) with a detection time of 4 UIs. A 2x-oversampling closed-loop bang-bang CDR is performed after the phase offset detection to provide jitter filtering. The switching between these two different oversampling ratios is realized in a single multi-phase clock generator (MPCG) by changing the duty-cycle in four differential quarter-rate clocks. Furthermore, fast duty-cycle switching (DCS) is introduced in the injection-locked ring oscillator (ILRO) design to speed up the transition from one sampling ratio to another. A prototype fabricated in 28-nm CMOS achieves a locking time of 1.6 ns at 30-Gb/s data rate, a BER of 1E-12 with a recovered clock integrated rms jitter of 398.4 fs. The jitter tolerance curve shows a corner frequency around 20 MHz with a 20-dB/dec slope in the low-frequency region. The receiver including the proposed CDR consumes 75.53 mW with 0.9-V supply and occupies an area of 0.148 mm2.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"61 1","pages":"318-330"},"PeriodicalIF":5.6000,"publicationDate":"2025-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10960670/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This article presents a closed-loop type burst-mode clock and data recovery (BM-CDR) circuit with fast phase offset detection using 8/3x-fractional oversampling in the periodic preamble. The proposed phase offset detector achieves a resolution of 1/8 unit intervals (UIs) with a detection time of 4 UIs. A 2x-oversampling closed-loop bang-bang CDR is performed after the phase offset detection to provide jitter filtering. The switching between these two different oversampling ratios is realized in a single multi-phase clock generator (MPCG) by changing the duty-cycle in four differential quarter-rate clocks. Furthermore, fast duty-cycle switching (DCS) is introduced in the injection-locked ring oscillator (ILRO) design to speed up the transition from one sampling ratio to another. A prototype fabricated in 28-nm CMOS achieves a locking time of 1.6 ns at 30-Gb/s data rate, a BER of 1E-12 with a recovered clock integrated rms jitter of 398.4 fs. The jitter tolerance curve shows a corner frequency around 20 MHz with a 20-dB/dec slope in the low-frequency region. The receiver including the proposed CDR consumes 75.53 mW with 0.9-V supply and occupies an area of 0.148 mm2.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.