Effects of electron beam irradiation on deoxynivalenol levels in distillers dried grain and solubles and in production intermediates.

T Stepanik, D Kost, T Nowicki, D Gaba
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引用次数: 24

Abstract

Wheat contaminated with deoxynivalenol (DON), and distillers dried grain and solubles (DDGS) obtained after ethanol production from the contaminated wheat, were irradiated to doses ranging from 2.0 to 55.8 kGy using an electron accelerator. Samples of wet distillers grain, distillers solubles and stillage obtained during production of DDGS were also irradiated. All samples were analysed for Fusarium trichothecene mycotoxins by a method involving use of gas chromatography-mass spectrometry (GC-MS). The three production intermediates showed dose-dependent reductions in their DON contents ranging from 47.5 to 75.5% at the highest doses. Electron beam treatment produced a 17.6% reduction in the DON level of wheat at the highest dose used, but had no effect on DON in DDGS. These results indicate that electron beam treatment may provide a method for reducing DON levels in DDGS on an industrial scale.

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电子束辐照对酒糟、干粮、可溶物及生产中间体中脱氧雪腐镰梨醇含量的影响。
用电子加速器对被脱氧雪腐镰刀菌醇(DON)污染的小麦,以及从被污染的小麦生产乙醇后得到的酒糟干谷物和可溶物(DDGS)进行辐照,辐照剂量为2.0 ~ 55.8 kGy。在DDGS生产过程中获得的湿酒糟、酒糟可溶物和蒸馏液样品也进行了辐照。采用气相色谱-质谱联用(GC-MS)方法对所有样品进行霉菌毒素分析。三种生产中间体的DON含量在最高剂量时呈剂量依赖性下降,下降幅度为47.5% ~ 75.5%。在最高剂量下,电子束处理使小麦的DON水平降低了17.6%,但对DDGS的DON没有影响。这些结果表明,电子束处理可能提供一种在工业规模上降低DDGS中DON水平的方法。
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