A brief review of mathematical models of thin film growth and surfaces. A possible route to avoid defects in stents.

Biomatter Pub Date : 2014-01-01 DOI:10.4161/biom.28871
Fabricio L Forgerini, Roberto Marchiori
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引用次数: 23

Abstract

The morphology of thin films has been extensively studied in the last years. The properties of a thin film are closely related to its microstructure, especially to its morphology and surface roughness. Optical reflectivity, conductivity, and porosity are characteristics that depend on the film structure. The knowledge of atomistic details of the thin film growth process is useful for the development of new techniques and the control of thin films and new materials. Models of growth process are very powerful tools that can help researchers to predict and control physical, chemical, and mechanical properties. In this work we briefly summarize the theoretical models that have been used in the studies of thin films growth. By describing the deposition process of atoms/molecules on the surface of the substrate, one can study the evolution of the bulk and the surface roughness of a thin film. If an experimental growth process is appropriately described by a theoretical model (or even a combination of one or more different models), it can also provide indications to control the surface roughness and porosity of the film. Controlling the growth process one can obtain materials with a set of desired properties, namely tribological, porosity, and electrical ones. These characteristics are necessary for example, for hosting a solid lubricant on the surface of the material. We believe that the models presented in this work can be very useful in understanding the mechanisms of control and adherence of electrodeposited films which are commonly used in medical applications such as stent devices. We also believe that the models can be helpful to the understanding surface problems related to the superficial defects in stents.

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薄膜生长和表面的数学模型综述。一种避免支架缺损的可能途径。
近年来,人们对薄膜的形貌进行了广泛的研究。薄膜的性能与其微观结构密切相关,尤其是其形貌和表面粗糙度。光学反射率、电导率和孔隙率是取决于薄膜结构的特性。了解薄膜生长过程的原子细节对新技术的发展和薄膜和新材料的控制都是有用的。生长过程的模型是非常强大的工具,可以帮助研究人员预测和控制物理、化学和机械性能。在这项工作中,我们简要地总结了在薄膜生长研究中使用的理论模型。通过描述原子/分子在衬底表面的沉积过程,可以研究薄膜体积和表面粗糙度的演变。如果用理论模型(甚至是一种或多种不同模型的组合)恰当地描述实验生长过程,它还可以提供控制薄膜表面粗糙度和孔隙率的指示。通过控制生长过程,可以获得具有一系列期望性能的材料,即摩擦学、孔隙率和电学性能。这些特性是必需的,例如,用于在材料表面上承载固体润滑剂。我们相信,在这项工作中提出的模型可以非常有用的理解控制和粘附机制的电沉积薄膜通常用于医疗应用,如支架装置。我们也相信这些模型可以帮助理解与支架表面缺陷有关的表面问题。
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