Encoding the complete electric field of an ultraviolet ultrashort laser pulse in a near-infrared nonlinear-optical signal.

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2020-08-31 DOI:10.1364/OE.402025
Travis Jones, William K Peters, Anatoly Efimov, Richard L Sandberg, Dmitry Yarotski, Rick Trebino, Pamela Bowlan
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引用次数: 3

Abstract

We introduce a variation on the cross-correlation frequency-resolved optical gating (XFROG) technique that uses a near-infrared (NIR) nonlinear-optical signal to characterize pulses in the ultraviolet (UV). Using a transient-grating XFROG beam geometry, we create a grating using two copies of the unknown UV pulse and diffract a NIR reference pulse from it. We show that, by varying the delay between the UV pulses creating the grating, the UV pulse intensity-and-phase information can be encoded into a NIR signal. We also implemented a modified generalized-projections phase-retrieval algorithm for retrieving the UV pulses from these spectrograms. We performed proof-of-principle measurements of chirped pulses and double pulses, all at 400 nm. This approach should be extendable deeper into the UV and potentially even into the extreme UV or x-ray range.

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用近红外非线性光信号编码紫外超短激光脉冲的完整电场。
我们介绍了一种互相关频率分辨光门控(XFROG)技术的变体,该技术使用近红外(NIR)非线性光信号来表征紫外线(UV)中的脉冲。使用瞬态光栅XFROG光束几何结构,我们使用未知紫外脉冲的两个副本创建光栅,并从中衍射近红外参考脉冲。我们表明,通过改变产生光栅的紫外脉冲之间的延迟,紫外脉冲的强度和相位信息可以被编码成近红外信号。我们还实现了一种改进的广义投影相位检索算法,用于从这些光谱图中检索紫外脉冲。我们进行了啁啾脉冲和双脉冲的原理验证测量,都在400纳米。这种方法应该扩展到更深的紫外线,甚至可能进入极端紫外线或x射线范围。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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