{"title":"IrMn Thickness Dependence of Exchange Bias Training Effect in CoFe/IrMn Thin Films","authors":"Seok-Soo Yoon, Dongyung Kim","doi":"10.4283/jkms.2023.33.1.049","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":42623,"journal":{"name":"Journal of the Korean Magnetics Society","volume":null,"pages":null},"PeriodicalIF":0.2000,"publicationDate":"2023-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Korean Magnetics Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4283/jkms.2023.33.1.049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}